Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Piperno L., Masi A., Cialone M., Iebole M., Botti S., Bonfigli F., Savio L.
Ключевые слова: HTS, REBCO, YBCO, films, coated conductors, fabrication, PLD process, chemical solution deposition, SmBCO, nanodoping, FeSeTe, pnictides
Ключевые слова: experimental results, chalcogenide, FeSeTe, coated conductors, PLD process, substrate Hastelloy, IBAD process, buffer layers, magnetron sputtering, targets, X-ray diffraction, thickness dependence, lattice parameter, resistive transition, critical temperature, microstructure, critical current density, pnictides, comparison, critical caracteristics, upper critical fields, Jc/B curves, temperature dependence, pinning force
Ключевые слова: chalcogenide, FeSeTe, coated conductors, PLD process, IBAD process, RABITS process, substrate Hastelloy, template layers, thin films, substrate single crystal, comparison, X-ray diffraction, lattice parameter, resistive transition, magnetization, temperature dependence, critical caracteristics, Jc/B curves, microstructure, fabrication, experimental results
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: chalcogenide, FeSe, wires, doping effect, fabrication, sintering, PIT process, ex-situ process, X-ray diffraction, microstructure, resistivity, temperature dependence, resistive transition, magnetic field dependence, upper critical fields, critical caracteristics, current-voltage characteristics, experimental results
Sylva G., Bellingeri E., Bernini C., Celentano G., Ferdeghini C., Leveratto A., Lisitskiy M., Malagoli A., Manca N., Mancini A., Manfrinetti P., Pallecchi I., Provino A., Putti M., Vannozzi A., Braccini V.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, buffer layers, texture, thickness dependence, RABITS process, substrate Hastelloy, substrate Ni-W, X-ray diffraction, microstructure, resistive transition, magnetic field dependence, critical caracteristics, Jc/B curves, critical temperature, upper critical fields
Abdyukhanov I.M., Lukyanov P.A., Pervakov K.S., Vlasenko V.A., Tsapleva A.S., Eltsev Y.F., Berbentsev V.D., Pudalov V.M.
Malagoli A., Ferdeghini C., Vannozzi A., Celentano G., Hopkins S.C., Braccini V., Putti M., Ballarino A., Bellingeri E., Sylva G., Lunt A.
Ключевые слова: FeSeTe, coated conductors, substrate metallic, texture, X-ray diffraction, microstructure, composition, distribution, fabrication, experimental results
Ferdeghini C., Braccini V., Putti M., Ghigo G., Gozzelino L., Pallecchi I., Pace S., Grimaldi G., Leo A., Nigro A., Martinelli A., Bellingeri E., Torsello D., Sylva G., Pellegrino L.
Ключевые слова: high field magnets, YBCO, FeSeTe, bulk, resistivity, temperature dependence, magnetic field dependence, experimental results
Ferdeghini C., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Bellingeri E., Sylva G.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, RABITS process, template layers, fabrication, substrate Ni-W, X-ray diffraction, PLD process, microstructure, buffer layers, texture, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: chalcogenide, FeSe, sheath, wires, fabrication, sintering, PIT process, X-ray diffraction, magnetization, critical temperature
Ключевые слова: chalcogenide, FeSe, tapes, sheath, precursors, powder processing, fabrication, PIT process, X-ray diffraction, microstructure, magnetization
Ключевые слова: FeSe, chalcogenide, tapes, in-situ process, ex-situ process, fabrication, PIT process, X-ray diffraction, composition, sintering, microstructure, magnetization
Ключевые слова: review, critical temperature, pressure effect, FeSe, H2S, MgB2, YBCO, HTS, laser irradiation, pulsed operation
Holzapfel B., Yamaguchi T., Iida K., Takeya H., Takano Y., Tanaka M., Fujioka M., Demura S., Okazaki H., Yamashita A., Denholme S.J., Sakata H.
Ключевые слова: chalcogenide, FeSe, RABITS process, tapes, electrochemical process, fabrication, critical temperature, susceptibility
Ключевые слова: FeSe, tapes, sheath, PIT process, fabrication, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, microstructure
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