Гуламова Д.Д., Маградзе О.В., Каримов А.В., Чигвинадзе Д.Г., Ашимов С.М., Бобокулов С.Х., Турдиев Ж.Ш., Бахронов Х.Н.
Ключевые слова: HTS, YBCO, films thick, coated conductors, chemical solution deposition, fabrication, substrate LaAlO3, buffer layers, substrate stainless steel, X-ray diffraction, microstructure, critical characteristics, critical current density, thickness dependence, temperature dependence, experimental results
Ключевые слова: pnictides, wires, tapes, fabrication, PIT process, critical characteristics, grain structure, microstructure, X-ray diffraction, mechanical treatment, critical current density, transport currents, magnetic field dependence, Jc/B curves, pinning force, angular dependence, mechanical properties, stress effects, strain effects, ac losses, long conductors, joints superconducting , review
Baldini M., Meng Y., Hemley R.J., Somayazulu M., Ahart M., Mishra A.K., Geballe Z.M., Struzhkin V.V.
Ключевые слова: MgB2, thin films, carbon, ion irradiation, irradiation effects, X-ray diffraction, critical characteristics, upper critical fields, heat treatment, annealing process, substrate single crystal, HPCVD process, resistive transition, magnetization, critical temperature, attice parameter, Jc/B curves, experimental results
Ключевые слова: HTS, YBCO, bulk, doping effect, thermal properties, critical temperature, composition, X-ray diffraction, lattice parameter, phase composition, microstructure, fabrication
Eisterer M., Tomsic M., Prikhna T.A., Moshchil V.E., Sverdun V.B., Rindfleisch M., Kozyrev A.V., Karpets M.V., Shaternik A.V., Romaka V.V., Ponomaryov S.S., Orlovskyi M.V.
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