Grasso G., Tumino A., Ferdeghini C., Hopkins S.C., Putti M., Vignolo M., Bernini C., Ballarino A., Tropeano M., Bovone G., Capra M., Loria F.
Ключевые слова: MgB2, wires, ex-situ process, fabrication, precursors, nanoscaled effects, powder processing, size effect, oxygen, composition, X-ray diffraction, microstructure, susceptibility, critical temperature, critical characteristics, Jc/B curves, magnetization, pinning centers, pinning force, experimental results
Ключевые слова: HTS, YBCO, bulk, nanodoping, nanoparticles, nanoscaled effects, pinning, critical characteristics, critical current density, magnetization, pinning centers, X-ray diffraction, lattice parameter, critical temperature, microstructure, Jc/B curves, pinning force, susceptibility, experimental results
Ключевые слова: HTS, YBCO, bulk, fabrication, powder processing, heat treatment, pressure dependence, X-ray diffraction, microstructure
Ключевые слова: HTS, YBCO, bulk, nanodoping, nanoparticles, nanoscaled effects, fabrication, powder metallurgy, melting, infiltration process, grain size, growth rate, levitation performance, trapped field distribution, magnetization, microstructure, X-ray diffraction, resistive transition, critical characteristics, Jc/B curves, peak effect
Ключевые слова: HTS, YBCO, bulk, fabrication, powder processing, tapes, X-ray diffraction, composition, microstructure
Ключевые слова: HTS, Bi2212, wires, fabrication, precursors, powder processing, microstructure, X-ray diffraction, current-voltage characteristics
Badica P., Sandu V., Aldica G., Vasylkiv O., Pasuk I., Burdusel M., Kuncser A., Grigoroscuta M.A., Suzuki T.S.
Ключевые слова: HTS, Bi2223, bulk, doping effect, whiskers, nanoscaled effects, pinning, X-ray diffraction, magnetization, microstructure, susceptibility, critical characteristics, Jc/B curves, pinning force
Ключевые слова: Bi2212, films, fabrication, electrophoretic deposition, stability, X-ray diffraction, critical temperature, resistive transition, microstructure, HTS
Ключевые слова: HTS, YBCO, films epitaxial, fabrication, substrate LaAlO3, powder processing, precipitation methods, optical imaging, microstructure, X-ray diffraction
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