Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Pompeo N., Angrisani A.A., Sotgiu G., Pinto V., Piperno L., Frolova A., Santoni A., Rondino F.
Baldini M., Meng Y., Hemley R.J., Somayazulu M., Ahart M., Mishra A.K., Geballe Z.M., Struzhkin V.V.
Ключевые слова: MgB2, thin films, carbon, ion irradiation, irradiation effects, X-ray diffraction, critical characteristics, upper critical fields, heat treatment, annealing process, substrate single crystal, HPCVD process, resistive transition, magnetization, critical temperature, attice parameter, Jc/B curves, experimental results
Ключевые слова: MgB2, carbon, doping effect, bulk, ion irradiation, irradiation effects, critical characteristics, critical current density, upper critical fields, magnetic field dependence, resistive transition, magnetic field dependence, X-ray diffraction, microstructure, Raman spectroscopy, pinning force, magnetic field dependence, experimental results
Ключевые слова: HTS, Bi2212, Bi2223, bulk, fabrication, grain boundaries, grain size, nanoscaled effects, annealing process, X-ray diffraction, calorimetric method, measurement technique, resistive transition, resistivity, temperature dependence, magnetic field dependence, susceptibility, irreversibility fields, magnetization, critical characteristics, Jc/B curves, current-voltage characteristics, experimental results
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