Ключевые слова: HTS, tapes, YBCO, substrate Hastelloy, substrate Ni-W, coils, ac losses, frequency dependence, measurement setup, modeling, transport currents, distribution, numerical analysis, comparison
Ключевые слова: chalcogenide, coated conductors, films, IBAD process, substrate Hastelloy, PLD process, buffer layers, X-ray diffraction, microstructure, resistive transition, critical temperature, upper critical fields, irreversibility fields, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: coated conductors, fabrication, substrate Hastelloy, buffer layers, ISD process, texture, microstructure
Yoshida Y., Iijima Y., Furuse M., Kakimoto K., Fujita S., Yoshida T., Daibo M., Ohsugi M., Hirata W.
Ключевые слова: power equipment, power electronics, grid operation, protective system, FCL resistive, design parameters, HTS, coated conductors, tapes, REBCO, substrate Hastelloy, coils pancake, overcurrent, current limiting characteristics, converters, current-voltage characteristics, measurement setup, fault currents, recovery characteristics, temperature distribution, test results
Ключевые слова: experimental results, chalcogenide, FeSeTe, coated conductors, PLD process, substrate Hastelloy, IBAD process, buffer layers, magnetron sputtering, targets, X-ray diffraction, thickness dependence, lattice parameter, resistive transition, critical temperature, microstructure, critical current density, pnictides, comparison, critical caracteristics, upper critical fields, Jc/B curves, temperature dependence, pinning force
Ключевые слова: HTS, YGdBCO, doping effect, pinning centers artificial, coated conductors, PLD process, IBAD process, substrate Hastelloy, X-ray diffraction, lattice parameter, microstructure, magnetization, temperature dependence, critical temperature, critical caracteristics, Jc/B curves, pinning force, pinning mechanism, critical current density, angular dependence, experimental results
Ключевые слова: HTS, EuBCO, coated conductors, fabrication, growth rate, high rate process, PLD process, IBAD process, substrate Hastelloy, doping effect, defects columnar, nanoscaled effects, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves, critical current density, angular dependence, experimental results
Ключевые слова: HTS, YBCO, GdBCO, EuBCO, SmBCO, YbBCO, DyBCO, buffer layers, MOD process, fluorine-free process, substrate Hastelloy, coated conductors, fabrication, X-ray diffraction, lattice parameter, microstructure, critical current density, critical caracteristics, Jc/B curves, pinning force, pinning mechanism, experimental results
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