Ключевые слова: presentation, review, HTS, REBCO, coated conductors, thickness dependence, critical characteristics, Jc/B curves
Ключевые слова: HTS, YBCO, films thick, coated conductors, chemical solution deposition, fabrication, substrate LaAlO3, buffer layers, substrate stainless steel, X-ray diffraction, microstructure, critical characteristics, critical current density, thickness dependence, temperature dependence, experimental results
Ключевые слова: measurement setup, eddy currents, ferromagnetic material, thickness dependence, impedance, HTS, coils, experimental results
Ключевые слова: measurement setup, magnetometer, vibration, critical characteristics, critical current density, temperature dependence, magnetic field dependence, self-field effect, pinning force, experimental results, HTS, coated conductors, films thick, thickness dependence, doping effect, composition, MOCVD process, YGdBCO
Ключевые слова: MgB2/Nb/Monel, tapes, fabrication, ex-situ process, precursors, powder processing, sintering, critical characteristics, X-ray diffraction, grain size, size effect, critical characteristics, current-voltage characteristics, critical current density, thickness dependence, transport currents, magnetic field dependence, susceptibility, temperature dependence, microstructure
Felner I., Tsindlekht M.I., Genkin V.M., Zeides F., Katz N., Gazi S., Chromik .S., Kolacek J., Marysko M.
Puig T., Palau A., Obradors X., Usoskin A., Coll M., Gazquez J., Ricart S., Li Z., Pop C., Valles F., Mundet B., Ros J., Chamorro N., Vallejo B., Pino F.
Ключевые слова: HTS, YBCO, films epitaxial, nanocomposites, nanoscaled effects, coated conductors, X-ray diffraction, microstructure, fluorine process, chemical solution deposition, nucleation, critical characteristics, critical current density, thickness dependence, composition, Jc/B curves, temperature dependence, angular dependence, experimental results
Eisterer M., Holzapfel B., Hanisch J., Schultz L., Huhne R., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Nielsch K., Ottolinger R.
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