Ключевые слова: presentation, HTS, YBCO, fabrication, MOCVD process, critical current density, thickness dependence, IBAD process, buffer layers
Schmidt W., Schoop U., Malozemoff A.P., Otto A., Verebelyi D., Neumueller H., Kraemer H., Wohlfart M.
Ключевые слова: HTS, YBCO, coated conductors, FCL resistive, coils bifilar, stabilizing layers, prototype, test results, recovery characteristics, power equipment
Ключевые слова: presentation, HTS, YBCO, coated conductors, economic analysis, review, capacity
Ключевые слова: HTS, coated conductors, buffer layers, fabrication, YBCO, nucleation, critical current, oxygenation treatments, TFA-MOD process, nanoscaled effects, presentation
Ключевые слова: HTS, coated conductors, overcurrent, modeling, experimental results, resistance, temperature dependence, YBCO, dynamic operation
Jia Q.X., Wang H., Stan L., Civale L., Maiorov B., Zhou H., Harrington S., Wimbush S., MacManus-Driscolll J.L., Durrell J.L.
Ключевые слова: HTS, coated conductors, YBCO, defects, grain alignment, microstructure, critical current density, thickness dependence, critical caracteristics, strain effects, pinning, Jc/B curves, angular dependence, MOD process, nanodots, magnetization, magnetic properties, critical caracteristics, experimental results, presentation, fabrication
Ayai N., Hayashi K., Sato K., Kobayashi S., Yamazaki K., Fujikami J., Kikuchi M., Hata R., YAMADE S., Kitaguti H.
Ключевые слова: presentation, HTS, YBCO, coated conductors, REBCO, nanodoping, critical current density, angular dependence, TFA-MOD process, PLD process, fabrication, defects, critical current, homogeneity, long conductors, thickness dependence, angular dependence, critical current density, critical caracteristics, experimental results, pinning centers artificial, grain size, microstructure
Puig T., Palau A., Obradors X., Pomar A., Sandiumenge F., Mestres N., Gazquez J., Gutierrez J., Roma N., Ricart S., Gibert M., Llordes A., Carretero A., Moreno C., Abellan P., Zabaleta J.
Ключевые слова: presentation, HTS, YBCO, chemical solution deposition, buffer layers, TFA-MOD process, precursors, nanodots, nucleation, fabrication, nanoscaled effects, pinning, microstructure, defects, strain effects, anisotropy, critical current density, angular dependence, critical caracteristics, temperature dependence, Jc/B curves, interfaces, pinning force, thickness dependence, experimental results
Selvamanickam V.(selva@igc.com), Xie Y.Y., Tarantini C., Chen Y., Xu A., Jaroszynski J., Lu J., Viouchkov Y., Griffin V., Larbalestierla D.
Izumi T., Ito T., Takahashi Y., Yamada Y., Sutoh Y., Miura M., Nakaoka K., Yoshizumi M., Ichikawa H., HiranoH., Tobita H., Y.Shiohara
Ключевые слова: presentation, HTS, YBCO, coated conductors, TFA-MOD process, fabrication, precursors, high rate process, critical current density
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, grain structure, texture, microstructure, fabrication
Ключевые слова: HTS, YBCO, substrate Ti, coated conductors, screen printing, fabrication
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