Kikuchi A., Iijima Y., Iijima Y., Ohuchi N., Tsuchiya K., Takao T., Wang X., Fujita S., Terashima A., Suzuki K., Tawada M., Daibo M., Masuzawa M., Norimoto K.
Ключевые слова: HTS, coated conductors, commercialization, helium, nitrogen liquid , critical caracteristics, YBCO, GdBCO, REBCO, comparison, IBAD process, PLD process, RCE-LATS process, MOCVD process, substrate Hastelloy, stabilizing layers, Cu-based conductors, critical current, n-value, magnetic field dependence, angular dependence, experimental results
Holzapfel B., Oomen M., Hassler W., Arndt T., Scheiter J., Kauffmann-Weiss S., Guenther E., Denneler S., Glosse P., Berthold T., Stocker T., Hanft D., Moos R., Weiss M., Weis F.
Iijima Y., Higashikawa K., Awaji S., Kiss T., Kakimoto K., Fujita S., Igarashi M., Fukuzaki T., Adachi Y., Naoe K., Yoshida T., Daibo M., Muto S., Hirata W.
Ключевые слова: HTS, GdBCO, EuBCO, coated conductors, fabrication, doping effect, PLD process, IBAD process, uniformity, homogeneity, substrate Hastelloy, critical caracteristics, critical current density, pinning force, magnetic field dependence, Jc/B curves, critical current, angular dependence, microstructure, temperature dependence, experimental results
Lee S., MOLODYK A., Samoilenkov S., Kaul A., Rudnev I., Petrykin V., Mineev N., Abin D., Chepikov V., Amelichev V., Pokrovskii S.
Ключевые слова: HTS, YGdBCO, nanoscaled effects, nanoparticles, doping effect, grain boundaries, angular dependence, buffer layers, critical caracteristics, TFA-MOD process, IBAD process, substrate Hastelloy, fabrication, critical current density, Jc/B curves, irreversibility fields, experimental results
Keilin V.E., Kovalev I.A., Novikov S.I., Novikov M.S., Shcherbakov V.I., Naumov A.V., Polyakov A.V., Surin M.I., Ilyin A.A., Makarenko M.N.
Ключевые слова: HTS, REBCO, substrate Hastelloy, coated conductors, current leads, solder, high current processing, design, stacked blocks, solder, fabrication, test results
Ключевые слова: presentation, HTS, REBCO, coated conductors, critical caracteristics, critical current, magnetic field dependence, mechanical properties, measurement setup, tensile tests, stress effects, strain effects, thickness dependence, substrate Hastelloy, stabilizing layers, n-value, irreversible strain, microstructure, laminations, delamination
Ключевые слова: mechanical properties, measurement setup, bending radius, tensile tests, strain effects, stress effects, stabilizing layers, thickness dependence, transverse stress, presentation, HTS, REBCO, coated conductors, IBAD process, MOCVD process, substrate Hastelloy, critical caracteristics, critical current, homogeneity, long conductors, Jc/B curves, width, electromechanical analysis
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