Takahashi K., Muroga T., Shiohara Y., Watanabe T., Kato T., Yamada Y., Hirayama T., Miyata S., Konishi M., Ibi A., Kobayashi H.
Ключевые слова: HTS, YBCO, YBCO, coated conductors, defects columnar, Jc/B curves, anisotropy, pinning, experimental results, microstructure, fabrication, critical caracteristics, substrate Hastelloy
Iijima Y., Kakimoto K.(kakimoto@rd.fujikura.co.jp), Saitoh T., Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, substrate Hastelloy, PLD process, coils solenoidal, reel-to-reel process, long conductors, current-voltage characteristics, critical current density, thickness dependence, tensile tests, bending process, experimental results, fabrication, power equipment, critical caracteristics, quality control
Prusseit W.(prusseit@theva.com), Nemetschek R., Hoffmann C., Lumkemann A., Kinder H., Sigl G.
Saitoh T., Kakimoto K., Kato T., Hirayama T., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, IBAD process, template layers, texture, fabrication
Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Watanabe T., Yamada Y., Matsuda J.S., Koyama S., Nakaoka K.
Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Teranishi R.(teranishi@istec.or.jp), Nakaoka K., Kitoh Y., Nomoto S.
Muroga T., Shiohara Y., Watanabe T., Yamada Y., Iwai H., Miyata S., Konishi M., Ibi A., Takahashi K.(ktakahashi@istec.or.jp)
Ключевые слова: HTS, REBCO, YBCO, REBCO, REBCO, coated conductors, substrate Hastelloy, Jc/B curves, experimental results, critical caracteristics
Iijima Y., Muroga T., Nagaya S., Kashima N., Saitoh T., Izumi T., Shiohara Y., Watanabe T., Kakimoto K., Yamada Y., Iwai H., Hirayama T., Sutoh Y., Niwa T., Miyata S., Sasaki H., Kato T.(tkato@jfcc.or.jp), Ikuhara Y., Ibi A., Sasaki Y.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, reel-to-reel process, CVD process, multistage process, substrate Hastelloy, grain alignment, microstructure, fabrication
Iijima Y., Saitoh T., Watanabe T., Kakimoto K., Yamada Y., Sakai N., Chikumoto N., Tajima S., Kato J.Y.(yoshioka@istec.or.jp)
Takahashi K., Muroga T., Shiohara Y., Watanabe T., Yamada Y., Iwai H., Miyata S., Ibi A.(ibi@istec.or.jp)
Ключевые слова: HTS, YBCO, coated conductors, texture, critical current, substrate Hastelloy, thickness dependence, fabrication, critical caracteristics
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y.(ysutoh@fujikura.co.jp), Kaneko N.
Saitoh T., Teranishi R., Izumi T., Shiohara Y., Fuji H.(hfuji@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Nakaoka K., Kito Y.
Schmidt W., Han Z., Wang L., Chen S., Du P., Wang S.S.(wangsansheng@tsinghua.org.cn), Neumuller H.W.
Osamura K., Semerad R., Itoh K., Prusseit W., Kiyoshi T., Sugano M.(sugano@kuee.kyoto-u.ac.jp)
Ключевые слова: HTS, YBCO, REBCO, REBCO, coated conductors, substrate Hastelloy, tensile tests, fracture behavior, ISD process, buffer layers, mechanical properties, critical current, strain effects, stress effects, microstructure, quench properties, fabrication, experimental results, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, stabilizing layers, substrate Hastelloy, IBAD process, MOCVD process, electroplating process, substrate Ni-W, RABITS process, MOD process, laminations, strain effects, critical current, critical current density, n-value, experimental results, critical caracteristics, fabrication, mechanical properties
Ma B., Koritala R.E., Fisher B.L., Dorris S.E., Miller D.J., Balachandran U., Maroni V.A., Uprety K.K.
Barnes P.N., Sathiraju S.(srinivas.sathiraju@wpafb.af.mil), Varanasi C.(chakrapani.varanasi@wpafb.af.mil), Wheeler R.(robert.wheeler@wpafb.af.mil)
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, buffer layers, IBAD process, microstructure, texture, fabrication
Ключевые слова: HTS, coated conductors, buffer layers, ISD process, surface, microstructure, substrate Hastelloy, PLD process, thickness dependence, angular dependence, fabrication
Muroga T., Nagaya S., Kashima N., Izumi T., Shiohara Y., Yamada Y., Miyata S., Watanabe T.(t-nabe@istec.or.jp), Niwa T.(Niwa.Toshiharu@chuden.co.jp), Mori M.(Mori.Masami2@chuden.co.jp)
Ключевые слова: HTS, YBCO, coated conductor modules, CVD process, multistage process, substrate Hastelloy, microstructure, texture, growth rate, fabrication
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