Meslin S., Vanderbemden P., Ausloos M., Cloots R., Noudem J.G., Laurent P.(laurent@montefiore.ulg.ac.be), Mathieu J., Fagnard J.
Vanderbemden P., Ausloos M., Cloots R., Grenci G., Dusoulier L., Vanderheyden B., Dirickx M., Denis S(sdenis@ulg.ac.be)*1)
Ключевые слова: HTS, YBCO, films thick, substrate Ag, electrodeposition, magnetic shielding, fabrication, experimental results
Weber H.W., Chaud X., Haindl S., Hengstberger F.(hengstb@ati.ac.at)
Ключевые слова: HTS, YBCO, bulk, single-domain, oxygenation treatments, perforated sample structure, trapped field, experimental results, magnetic properties
Obradors X., Iliescu S., Bozzo B., Amoros J., Carrera M., Granados X.(granados@icmab.es), Moreno E.
Ключевые слова: HTS, YBCO, bulk, current distribution, modeling computational
Babu N.H., Cardwell D.A., Koblischka-Veneva A., Koblischka M.R.(m.koblischka@mx.uni-saarland.de), Winter M., Hartmann U.
Ключевые слова: HTS, YBCO, bulk, nanodoping, microstructure, fabrication
Babu N.H., Cardwell D.A., Koblischka M.R., Mucklich F., Koblischka-Veneva A.(a.koblischka-veneva@mx.uni-saarland.de), Holzapfel C.
Ключевые слова: HTS, bulk, doping effect, grain alignment, YBCO, nanoparticles, phase diagram, fabrication, precursors
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, mechanical properties, thermal stress, substrate sapphire, PLD process, microstructure, fabrication
Nakamura Y., Oota A.(oota@eee.tut.ac.jp), Inada R.(inada@eee.tut.ac.jp)
Ключевые слова: ac losses, cables, tapes, aspect ratios, current distribution, HTS, YBCO, coated conductors, numerical analysis, measurement technique, power equipment
Fukuoka K.(kfukuoka@uitec.ac.jp), Hashimoto M.
Ключевые слова: transformers, magnetic shielding, HTS, bulk, YBCO, frequency dependence, experimental results, power equipment
Christen D.K., Hawsey R.A.(hawseyra@ornl.gov)
Ключевые слова: HTS, coated conductors, review, YBCO, PLD process, MOCVD process, TFA-MOD process, IBAD process, long conductors, fabrication
Kakimoto K., Sutoh Y., Ajimura S., Saitoh T.(tsaitoh@fujikura.co.jp), Kaneko N., Hanyu S., Iijima Y.(iijimay@fujikura.co.jp)
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, long conductors, fabrication, length
Muroga T., Nagaya S., Kashima N., Izumi T., Watanabe T., Yamada Y., Miyata S., Shiohara Y.(shiohara@istec.or.jp), Mori M.(Mori.Masami2@chuden.co.jp)
Ключевые слова: HTS, YBCO, coated conductors, CVD process, multistage process, IBAD process, MOCVD process, long conductors, high rate process, fabrication
Kim C.-J.(cjkim2@kaeri.re.kr), Jun B.-H., Choi J.-K.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, template layers, buffer layers, RABITS process, IBAD process, comparison, fabrication, critical current, critical caracteristics
Thieme C.L., Li X., Kodenkandath T., Goyal A., Heatherly L., Sathyamurthy S., Martin P.M., Rupich M.W.(mrupich@amsuper.com), Paranthaman M.P.(paranthamanm@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, MOD process, buffer layers, chemical solution deposition, substrate Ni-W, fabrication
Teranishi R., Fuji H., Aoki Y., Izumi T.(izumi@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Nakaoka K., Kitoh Y., Nomoto S.
Ключевые слова: HTS, coated conductors, TFA-MOD process, long conductors, review, YBCO, critical current, thickness dependence, Jc/B curves, fabrication, critical caracteristics
Teranishi R., Fuji H., Izumi T., Shiohara Y., Miyata S., Nakaoka K., Kitoh Y., Aoki Y.(y-aoki@istec.or.jp), Nomoto S., Matuda J.
Joo J., Hong G., Kim H., Lee S., Yoo J., Jang S.H., Song S., Kim B., Lee H.(hglee@kpu.ac.kr), Park J.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, precursors, TFA-MOD process, critical current, critical current density, fabrication, critical caracteristics
Kim J., Lim J.H., Kim H., Jang S.H., Lee J.S., Ha H., Jung S., Yoon K.M., Joo J.(jinho@skku.edu), Nah W.S.(wsnah@yurim.skku.ac.kr)
Ключевые слова: HTS, YBCO, fabrication, precursors, substrate LaAlO3, films, critical current, critical current density, phase formation, critical caracteristics
Iijima Y., Kakimoto K., Sutoh Y., Saitoh T.(tsaitoh@fujikura.co.jp), Hanyu S., Kaneko N.(nkaneko@fujikura.co.jp)
Ключевые слова: HTS, YBCO, IBAD process, template layers, substrate Ni alloy, nanoscaled roughness, grain alignment, fabrication, coated conductors
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