Ключевые слова: FCL resistive, HTS, YBCO, films, meander, spiral lines, quench, FCL three-phase, test results, power equipment
MacManus-Driscoll J.L., Blamire M.G., Rutter N.A.(nar20@cam.ac.uk), Durrell J.H., Mennema S.H.(shm32@cam.ac.uk)
Ключевые слова: HTS, YBCO, coated conductors, YBCO, substrate Ni-W, RABITS process, PLD process, texture, heat treatment, Jc/B curves, anisotropy, fabrication, experimental results, critical caracteristics
Iijima Y., Awaji S., Watanabe K., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Izumi T., Shiohara Y., Inoue M., Kakimoto K., Matsuda J., Sawa H., Tsuda Y.
Christen D.K., Thompson J.R., Feenstra R., Gapud A.A., Holesinger T.G.(tgholesinger@lanl.gov)
Kreiskott S., Matias V., Jia Q.X., Holesinger T.G., Gibbons B.J., Civale L., Maiorov B.(maiorov@lanl.gov)
Weijers H.W., Schwartz J., Zhang G., Wang X.(xiaorong@caps.fsu.edu), Caruso A.R.(caruso@magnet.fsu.edu), Breschi M.(marco.breschi@unibo.it), Trociewitz U.P.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Ajimura S.(sajimura@fujikura.co.jp)
Ключевые слова: HTS, coated conductors, buffer layers, IBAD process, YBCO, PLD process, reel-to-reel process, long conductors, coils, critical current, thickness dependence, critical current distribution, homogeneity, current-voltage characteristics, upper critical fields, critical caracteristics, fabrication, power equipment, substrate Hastelloy, magnetic properties
Selvamanickam V., Knoll A., Xie Y., Li Y., Chen Y., Reeves J., Xiong X., Qiao Y., Salagaj T., Lenseth K., Hazelton D., Reis C., Yumura H., Weber C.
Muroga T., Shiohara Y., Watanabe T., Yamada Y., Iwai H., Miyata S., Ibi A.(ibi@istec.or.jp), Katoh T.(tkato@jfcc.or.jp), Hirayama T.(hirayama@jfcc.or.jp)
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, critical current, PLD process, reel-to-reel process, long conductors, IBAD process, critical caracteristics, fabrication, length
Usoskin A., Rutt A., Knoke J.(jknoke@gwdg.de), Krauth H.(Helmut.Krauth@advancedsupercon.com), Arndt T.J.(Thomas.Arndt@advancedsupercon.com)
Rupich M.W., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Goyal A., Paranthaman M., Verebelyi D.T., Civale L., Maiorov B., Holesinger T.
Yoo J., Ko J., Kim Y.-K.(voice21@kmail.kimm.re.kr), Lee K.-H.(lgh1636@kmail.kimm.re.kr), Chung K.(kcchung@kmail.kimm.re.kr), Chung H.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, texture, electrodeposition, buffer layers, PLD process, fabrication
Ключевые слова: HTS, YBCO, substrate NbN/Si, buffer layers, co-evaporation process, fabrication, texture, microstructure, critical current, critical caracteristics
Rupich M.W., Thieme C.L., Schoop U., Li X., Zhang W., Kodenkandath T., Goyal A., Verebelyi D.T., Paranthaman M.P., Sathyamurthy S., Bhuiyan M.S.
Rupich M.W., Li X., Kodenkandath T., Rane M.V.(mrane@uamail.albany.edu), Efstathiadis H., Bakhru H.((hb694@albany.edu), Zhang W.(wzhang@amsuper.com), Haldar P.
Ключевые слова: HTS, YBCO, TFA-MOD process, microstructure, buffer layers, interfaces, fabrication
Holzapfel B., Schultz L., Apetrii C.(c.apetrii@ifw-dresden.de), Schlorb H., Falter M., Lampe I.(lamp0634@mailbox.tu-berlin.de)
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