Freyhardt H.C., Eickemeyer J., Donet S., Weiss F.(Francois.Weiss@inpg.fr), Chaudouet P., Beauquis S., Abrutis A., Usokin A.(usokin@umpsun1.gwdg.de), Selbmann D., Jimenez C.(jimenez@jipelec.com), Bruzek C.E.(Christian_Eric.Bruzek@nexans.com), Saugrain J.M.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, reel-to-reel process, substrate Ni, critical current density, fabrication, critical caracteristics
Osamura K., Ono T., Hirabayashi I., Matsumoto K., Takechi A.(takechi@kumax.kyoto-u.ac.jp)
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, SOE process, cap layers, PLD process, microstructure, critical current density, fabrication, critical caracteristics
Ji B.K., Jung C., Park S., Jun B., Hong G., Park H., Kim C., Sun J. ex-sun@kaeri.re.kr), Kim H.S.(hskim@cnu.ac.kr)
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, SOE process, MOCVD process, microstructure, fabrication
Wozniak U., Linker G.(Gerhard.Linker@ifp.fzk.de), Geerk J.(Jochen.Greek@ifp.fzk.de)
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, substrate Ni, substrate Ni-Cr, SOE process, magnetron sputtering, microstructure, fabrication
Osamura K., Matsumoto K., Takechi A.(takechi@sd6.so-net.ne.jp)
Ключевые слова: HTS, YBCO, coated conductors, MOD process, buffer layers, substrate SrTiO3, PLD process, critical current density, fabrication, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, substrate Ni, MOCVD process, microstructure, fabrication
Ключевые слова: HTS, coated conductors, seed layers, PLD process, YBCO, LPE process, substrate single crystal, fabrication, new
Ключевые слова: HTS, coated conductors, buffer layers, magnetron sputtering, magnetron sputtering, YBCO, substrate Ni, microstructure, fabrication
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, substrate Ni, chemical solution deposition, IBAD process, microstructure, fabrication
Akin Y., Hascicek Y.S., Sigmund W., Celik E., Aslanoglu Z., Arda L.(arda@magnet.fsu.edu)
Ключевые слова: HTS, coated conductors, buffer layers, chemical solution deposition, substrate Ni, YBCO, microstructure, fabrication
Akin Y., Hascicek Y.S., Aslanoglu Z., Okuyucu H.(okuyucu@gazi.edu.tr), Arda L., Heiba Z.K.(zein_kh@hotmail.com), El-Kawni M.I.(elkawani@magnet.fsu.edu), Tolliver J.C., Barnes P.N.
Fisher B.L., Miller D.J., Balachandran U., Koritala R.E.(koritala@anl.gov), Beihai M., Meiya L.
Ключевые слова: HTS, YBCO, coated conductors, template layers, buffer layers, ISD process, microstructure, fabrication, substrate Ni-V
Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Dorris S.E., Miller D.J., Balachandran U., Meiya L., Beihai M.(bma@anl.gov)
Qiao Y., Reeves J., Lenseth K., Selvamanickam V., Zdun K., Xie J., Hope L., Yijie L.(yli@igc.com), Corcoran S.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, reel-to-reel process, microstructure, critical current density, fabrication, critical caracteristics
Ueda H.(ueda@super.elec.waseda.ac.jp), Itoh M.(manabu_ito@fuji.waseda.jp), Ishiyama A.
Ключевые слова: HTS, YBCO, bulk, disks, ac losses, numerical analysis, trapped field, experimental results, magnetic properties
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