Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: chalcogenide, FeSe, wires, doping effect, fabrication, sintering, PIT process, ex-situ process, X-ray diffraction, microstructure, resistivity, temperature dependence, resistive transition, magnetic field dependence, upper critical fields, critical caracteristics, current-voltage characteristics, experimental results
Sylva G., Bellingeri E., Bernini C., Celentano G., Ferdeghini C., Leveratto A., Lisitskiy M., Malagoli A., Manca N., Mancini A., Manfrinetti P., Pallecchi I., Provino A., Putti M., Vannozzi A., Braccini V.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, buffer layers, texture, thickness dependence, RABITS process, substrate Hastelloy, substrate Ni-W, X-ray diffraction, microstructure, resistive transition, magnetic field dependence, critical caracteristics, Jc/B curves, critical temperature, upper critical fields
Abdyukhanov I.M., Lukyanov P.A., Pervakov K.S., Vlasenko V.A., Tsapleva A.S., Eltsev Y.F., Berbentsev V.D., Pudalov V.M.
Murakami M., Koblischka M.R., Koblischka-Veneva A., Muralidhar M., Douine B., Berger K., Nouailhetas Q.
Ferdeghini C., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Bellingeri E., Sylva G.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, RABITS process, template layers, fabrication, substrate Ni-W, X-ray diffraction, PLD process, microstructure, buffer layers, texture, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: presentation, pnictides, wires, tapes, review, critical caracteristics, upper critical fields, anisotropy, Jc/B curves, coated conductors, PLD process, molecular beam epitaxy, resistance, critical current density, temperature dependence, pinning force, chalcogenide, resistivity, microstructure, PIT process, texture, porosity, hot isostatic pressing, mechanical treatment, sintering, current-voltage characteristics, fabrication, sheath, strain effects, mechanical properties, bending radius, tensile tests, joints, long conductors, coils pancake, coils racetrack, review
Ключевые слова: chalcogenide, FeSe, sheath, wires, fabrication, sintering, PIT process, X-ray diffraction, magnetization, critical temperature
Ключевые слова: chalcogenide, FeSe, tapes, sheath, precursors, powder processing, fabrication, PIT process, X-ray diffraction, microstructure, magnetization
Ключевые слова: chalcogenide, coated conductors, PLD process, IBAD process, buffer layers, substrate metallic, resistive transition, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, critical current density, angular dependence, anisotropy
Ключевые слова: FeSe, chalcogenide, tapes, in-situ process, ex-situ process, fabrication, PIT process, X-ray diffraction, composition, sintering, microstructure, magnetization
Ferdeghini C., Braccini V., Pace S., Guarino A., Grimaldi G., Leo A., Nigro A., Bellingeri E., Avitabile F., Marra P., Citro R.
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