Izumi T., Shiohara Y., Watanabe T.(t-nabe&istec.or.jp)
Ключевые слова: HTS, YBCO, REBCO, coated conductors, substrates, buffer layers, fabrication, IBAD process, PLD process, critical current density, review, critical caracteristics
Usoskin A., Oomen M.P., Freyhardt H.C.(hfreyha@gwdg.de), Issaev A.(issaev@umpsun1.gwdg.de), Dzick J.(jurgen.dzick@schott.com), Knoke J.(knoke@umpsun1.gwdg.de), Leghissa M.(martino.leghissa@erls.siemens.com), Neumueller H.-W.(Heinz-Werner-Neumueller@erls.siemens.de)
Ключевые слова: HTS, YBCO, coated conductors, substrate stainless steel, IBAD process, PLD process, fabrication, critical current, critical caracteristics
Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Malozemoff A.P., Nguyen N., Siegal E., Buczek D., Lynch J., Scudiere J., Goyal A., Paranthaman M., Verebelyi D.T., Jowett M., Rupich M.W.(mrupich@amsuper.com), Thompson E., Wang J.-., Li Q., Annavarapu S., Cui S., Fritzemeier L., Aldrich B., Craven C., Niu F., Schwall R.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, MOD process, critical current, fabrication, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, current-voltage characteristics, n-value, fabrication, critical caracteristics, length
Arendt P.N., Foltyn S.R., DePaula R.F., Stan L., Groves J.R., Holesinger T.G., Aytug T., Christen D.K., Paranthaman M.P., Kang S., Feenstra R., Budai J.D.
Watanabe T., Maeda T., Mimura M., Ohashi Y., Hirabayashi I.(hirazum@istec.or.jp)
Selvamanickam V., Hatzistergos M.S., Efstathiadis H.(hefstathiadis@uamail.albany.edu), Lifshin E., Kaloyeros A.E., Reeves J.L., Allen L.P.(lallen@epion.com), MacCrimmon R.
Ключевые слова: HTS, YBCO, coated conductors, substrate SrTiO3, MOCVD process, microstructure, critical current density, critical caracteristics, fabrication
Iijima Y., Nakamura Y., Saitoh T., Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Honjo T.
Ключевые слова: HTS, YBCO, coated conductors, MOD process, microstructure, critical current density, fabrication, critical caracteristics
Iijima Y., Shiohara Y., Aoki Y., Hasegawa T., Watanabe T., Maeda T., Honjo T., Yamada Y., Saito T., Hirabayashi I., Takahashi Y.*(k920112@sntl.swcc.co.jp))
Freyhardt H.C., Eickemeyer J., Donet S., Weiss F.(Francois.Weiss@inpg.fr), Chaudouet P., Beauquis S., Abrutis A., Usokin A.(usokin@umpsun1.gwdg.de), Selbmann D., Jimenez C.(jimenez@jipelec.com), Bruzek C.E.(Christian_Eric.Bruzek@nexans.com), Saugrain J.M.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, reel-to-reel process, substrate Ni, critical current density, fabrication, critical caracteristics
Osamura K., Ono T., Hirabayashi I., Matsumoto K., Takechi A.(takechi@kumax.kyoto-u.ac.jp)
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, SOE process, cap layers, PLD process, microstructure, critical current density, fabrication, critical caracteristics
Osamura K., Matsumoto K., Takechi A.(takechi@sd6.so-net.ne.jp)
Ключевые слова: HTS, YBCO, coated conductors, MOD process, buffer layers, substrate SrTiO3, PLD process, critical current density, fabrication, critical caracteristics
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