Han Z., Liu Q., Homeyer J., Andersen N.H., Chen X.P.(xpchen@tsinghua.edu.cn), Grivel J.-C., Li M.Y.
Ключевые слова: HTS, Bi2223/Ag, tapes, precursors, phase formation, heat treatment, Jc/B curves, anisotropy, microstructure, fabrication, experimental results, critical caracteristics
Osamura K., Nakamura T., Muta I., Hoshino T., BALAMURUGAN S.(SARKARAINADAR.Balamurugan@nims.go.jp)
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni, substrate Ni-W, RABITS process, microstructure, fabrication
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, buffer layers, chemical solution deposition, fabrication, microstructure
Iijima Y., Saitoh T., Teranishi R., Tokunaga Y., Fuji H., Asada S., Izumi T., Shiohara Y., Kaneko A., Honjo T., Matsuda J.S.(jmatsuda@istec.or.jp), Yajima A.
Ключевые слова: HTS, YBCO, coated conductors, microstructure, heat treatment, TFA-MOD process, fabrication, substrate Hastelloy, IBAD process
Nagaya S., Kashima N., Doi T., Lee N.J.(njlee@elib.eee.kagoshima-u.ac.jp), Hakuraku Y.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ag, MOD process, microstructure, fabrication
Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Honjo T., Matsuda J., Yajima A., Teranishi R.(teranishi@istec.or.jp)
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, substrate SrTiO3, microstructure, critical current density, fabrication, critical caracteristics
Hahakura S.(hahakura-shuji@sei.co.jp), Ohmatsu K., Fujino K., Konishi M.
Nagaya S., Kashima N., Inoue K., Hakuraku Y., Doi T.(doi@eee.kagoshima-u.ac.jp), Kozono T.
Ключевые слова: HTS, YBCO, REBCO, coated conductors, substrate Ag, PLD process, MOD process, microstructure, current-voltage characteristics, fabrication, critical caracteristics
Izumi T., Shiohara Y., Hayashi A.(hayashi@ceram.rd.pref.gifu.jp), Kurachi K., Seiki S.
Ключевые слова: HTS, YBCO, bulk, rods, fabrication, current leads, critical current, microstructure, mechanical properties, critical caracteristics
Togano K., Kumakura H., Matsumoto A., Ma Y.(mayanwei@yahoo.com), Takeya H.
Ключевые слова: MgB2/Fe, PIT process, fabrication, microstructure, Jc/B curves, critical caracteristics
Iijima Y., Muroga T., Saitoh T., Izumi T., Shiohara Y., Yamada Y., Hirayama T., Hirabayashi I., Kato T.(tkato@jfcc.or.jp), Ikuhara Y.
Ключевые слова: HTS, YBCO, substrate Hastelloy, buffer layers, grain alignment, microstructure, IBAD process, PLD process, fabrication, coated conductors
Iijima Y., Saitoh T., Kakimoto K., Ajimura S., Sutoh Y.(ysutoh@fujikura.co.jp)
Watanabe T., Mimura M., Ohashi Y., Maeda T.(maeda.toshihiko@furukawa.co.jp), Nagasu Y.
Ключевые слова: HTS, coated conductors, substrate Ni-V, substrate Ni-W, mechanical properties, microstructure
Ji B.K., Lim J.H., Nah W., Kim K.T., Kim J.H., Hong G.-W., Kim C.-J., Jun B.-H., Joo J.(jinho@skku.ac.kr)
Ключевые слова: HTS, coated conductors, substrate Ni-W, substrate Ni, texture, grain alignment, fabrication, microstructure
Izumi T., Izumi T., Shiohara Y., Maeda T., Hasegawa K.(khasegawa@istec.or.jp)
Ключевые слова: HTS, coated conductors, substrate Ni, oxygenation treatments, grain boundaries, grain alignment, fabrication, microstructure
Venkataraman K., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Lynch J., Scudiere J., Verebelyi D.T., Holesinger T.G., Rupich M.W.(mrupich@amsuper.com), Teplitsky M., Maroni V., Miller D.
Ключевые слова: HTS, coated conductors, RABITS process, MOD process, YBCO, substrate Ni-W, fabrication, microstructure, critical current density, review, critical caracteristics
Shiohara Y., Takahashi Y.(k920112@snt1.swcc.co.jp), Aoki Y., Hasegawa T., Maeda T., Honjo T., Yamada Y.
Ключевые слова: HTS, YBCO, coated conductors, MOD process, substrate Ni, buffer layers, microstructure, critical current density, fabrication, critical caracteristics
Osamura K., Muta I., Hoshino T., Nakamura T.(tk_naka@kuee.kyoto-u.ac.jp), Balamurugan S.
Ключевые слова: MgB2/Fe, wires, PIT process, resistivity, temperature dependence, microstructure, critical current density, critical caracteristics, fabrication
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