Ключевые слова: measurement technique, interfaces, roughness, wires, filaments, LTS, Nb, alloys, Nb3Sn
Sun Z., Shao Y., Baraissov Z., Muller D.A., Thompson M.O., Liepe M.U., Porter R.D., Shpani L., Oseroff T.
Ключевые слова: electrochemical process, cavity, fabrication, LTS, Nb3Sn, thin films, roughness, X-ray diffraction, microstructure, resistive transition
Ключевые слова: HTS, YBCO, tapes, stacked blocks, cables, interstrand contact resistances, heat treatment, resistance, pressure dependence, measurement setup, surface, coatings, roughness
Ключевые слова: HTS, GdBCO, coated conductors, tapes, magnetron sputtering, overcurrent, ac performance, stabilizing layers, surface, plasma treatments, microstructure, roughness, experimental results
Ключевые слова: HTS, GdBCO, tapes, design parameters, stabilizing layers, coils, insulationless, winding tension, surface, roughness, oxygenation treatments, microstructure, measurement setup, contact characteristics, resistance, current-voltage characteristics, transport currents, experimental results
Ключевые слова: HTS, Bi2212, films, fabrication, sol gel process, substrate LaAlO3, substrate SrTiO3, microstructure, surface, roughness, resistivity, temperature dependence, resistive transition, magnetic field dependence, irreversibility fields, critical temperature, X-ray diffraction, experimental results
Ключевые слова: nitrogen liquid , voltage, pulsed operation, discharge characteristics, dielectrics, surface, roughness, measurement setup, experimental results
Ключевые слова: HTS, YBCO, bulk, solid-state synthesis, doping effect, lattice parameter, levitation performance, X-ray diffraction, optical properties, microstructure, critical temperature, roughness, critical caracteristics, critical current density, resistive transition, mechanical properties, hardness, experimental results
Ключевые слова: boiling, experimental results, microstructure, brass laminate, cooling technology, nitrogen liquid , surface, roughness
Ключевые слова: cryogenic systems, heat transfer, interfaces, substrate metallic, thermal conductivity, contact characteristics, temperature dependence, Cu-based conductors, stainless steel, brass laminate, cryocoolers, roughness, surface, deformation, measurement technique, microstructure, experimental results
Ключевые слова: coated conductors, fabrication, MOD process, cap layers, manganites, buffer layers, critical caracteristics, X-ray diffraction, roughness, surface, lattice parameter, critical current density, temperature dependence, microstructure, critical current, distribution, experimental results, HTS, YBCO
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Jr., Rizzo F., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor T. J., Celentano a.G.
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