Ключевые слова: measurement technique, interfaces, roughness, wires, filaments, LTS, Nb, alloys, Nb3Sn
Sun Z., Shao Y., Baraissov Z., Muller D.A., Thompson M.O., Liepe M.U., Porter R.D., Shpani L., Oseroff T.
Ключевые слова: electrochemical process, cavity, fabrication, LTS, Nb3Sn, thin films, roughness, X-ray diffraction, microstructure, resistive transition
Ключевые слова: HTS, YBCO, tapes, stacked blocks, cables, interstrand contact resistances, heat treatment, resistance, pressure dependence, measurement setup, surface, coatings, roughness
Ключевые слова: HTS, GdBCO, coated conductors, tapes, magnetron sputtering, overcurrent, ac performance, stabilizing layers, surface, plasma treatments, microstructure, roughness, experimental results
Ключевые слова: HTS, GdBCO, tapes, design parameters, stabilizing layers, coils, insulationless, winding tension, surface, roughness, oxygenation treatments, microstructure, measurement setup, contact characteristics, resistance, current-voltage characteristics, transport currents, experimental results
Ключевые слова: HTS, Bi2212, films, fabrication, sol gel process, substrate LaAlO3, substrate SrTiO3, microstructure, surface, roughness, resistivity, temperature dependence, resistive transition, magnetic field dependence, irreversibility fields, critical temperature, X-ray diffraction, experimental results
Ключевые слова: nitrogen liquid , voltage, pulsed operation, discharge characteristics, dielectrics, surface, roughness, measurement setup, experimental results
Ключевые слова: HTS, YBCO, bulk, solid-state synthesis, doping effect, lattice parameter, levitation performance, X-ray diffraction, optical properties, microstructure, critical temperature, roughness, critical caracteristics, critical current density, resistive transition, mechanical properties, hardness, experimental results
Ключевые слова: boiling, experimental results, microstructure, brass laminate, cooling technology, nitrogen liquid , surface, roughness
Ключевые слова: cryogenic systems, heat transfer, interfaces, substrate metallic, thermal conductivity, contact characteristics, temperature dependence, Cu-based conductors, stainless steel, brass laminate, cryocoolers, roughness, surface, deformation, measurement technique, microstructure, experimental results
Ключевые слова: coated conductors, fabrication, MOD process, cap layers, manganites, buffer layers, critical caracteristics, X-ray diffraction, roughness, surface, lattice parameter, critical current density, temperature dependence, microstructure, critical current, distribution, experimental results, HTS, YBCO
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Jr., Rizzo F., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor T. J., Celentano a.G.
Petrisor T., Ciontea L., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Nasui M., Pinto V., Piperno L., Gabor M.
Ключевые слова: HTS, coated conductors, fabrication, substrate Hastelloy, buffer layers, planarization, MOD process, roughness, YBCO, PLD process, laminations
Ключевые слова: HTS, YBCO, pinning centers artificial, IBAD process, pinning, PLD process, X-ray diffraction, lattice parameter, composition, microstructure, roughness, magnetization, pinning force, critical current, Jc/B curves, critical current density, angular dependence, magnetic field dependence, substrate SrTiO3, comparison, substrate Hastelloy, nanodots, nanorods, nanoscaled effects, experimental results
Ключевые слова: MgB2, films, annealing process, roughness, porosity, microstructure, fabrication, resistive transition, critical caracteristics, Jc/B curves
Ключевые слова: ITER, LTS, Nb3Sn, cable-in-conduit conductor, design parameters, prototype, cycling, SULTAN, strands, surface, roughness, twist-pitch, microstructure, test results
Ключевые слова: HTS, YBCO, single crystals, surface, roughness, magnetic field distribution, Meissner effect, experimental results, numerical analysis
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, chemical solution deposition, buffer layers, films epitaxial, texture, fabrication, microstructure, roughness
Ключевые слова: HTS, YBCO, coated conductors, critical caracteristics, critical current density, fabrication, cap layers, magnetron sputtering, surface, microstructure, roughness
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, roughness, microstructure, magnetron sputtering, IBAD process, substrate Hastelloy, fabrication
Ключевые слова: LTS, Nb3Sn, fabrication, barriers, tubes, grain size, interfaces, roughness, mechanical properties, hardness
Ключевые слова: HTS, Bi2212, doping effect, mechanical properties, hardness, roughness, tensile tests, stress effects, strain effects, bulk, modeling, deformation, experimental results
Ключевые слова: HTS, YBCO, REBCO, coated conductors, fabrication, homogeneity, critical caracteristics, critical current, n-value, roughness, substrate Hastelloy, texture, angular dependence, magnetic field dependence, measurement setup, mechanical properties, tensile tests, strain effects, stress effects, laminations, measurement setup, displacements, Roebel conductors, CORC cables, twisting, insulation, presentation
Ключевые слова: HTS, YBCO, coated conductors, thermal stability, nitrogen liquid , surface, roughness, quench properties, overcurrent, heat transfer, experimental results
Ключевые слова: HTS, coated conductors, substrate Ni-W, texture, buffer layers, surface, roughness, mechanical treatment, fabrication, quality control
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, co-evaporation process, cycling, planarization, fabrication, solution techniques, roughness, microstructure, width
Ключевые слова: HTS, coated conductors, REBCO, IBAD process, buffer layers, surface, roughness, substrate Ni alloy, fabrication, doping effect
Ключевые слова: HTS, YBCO, coated conductors, PLD process, fabrication, substrate Ni-W, buffer layers, oxygenation treatments, microstructure, roughness, texture, RABITS process
Ключевые слова: presentation, HTS, YBCO, coated conductors, RABITS process, fabrication, seed layers, substrate Ni-W, mechanical properties, ferromagnetic loss, roughness, critical caracteristics, critical current, buffer layers, long conductors, homogeneity, Jc/B curves, microstructure, films epitaxial, texture, template layers, nanoscaled effects
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, commercialization, long conductors, fabrication, roughness, planarization, texture, substrate Hastelloy, microstructure, irradiation effects, growth rate, defects, pinning, critical caracteristics, critical current density, angular dependence, Jc/B curves, nanoscaled effects, nanodots, phase composition, defects columnar, homogeneity, critical current, thickness dependence
Ключевые слова: presentation, HTS, YBCO, coated conductors, commercialization, MOD process, RABITS process, long conductors, review, critical caracteristics, critical current, homogeneity, substrate Ni-W, texture, magnetic properties, roughness, REBCO, doping effect, thickness dependence, Jc/B curves, angular dependence, fabrication
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, critical caracteristics, critical current, angular dependence, homogeneity, long conductors, doping effect, coils, economic analysis, planarization, roughness, solution techniques, microstructure, magnetic field dependence, temperature dependence, Jc/B curves, flux creep, pinning, experimental results
Ключевые слова: HTS, YBCO, films epitaxial, substrate single crystal, chemical solution deposition, buffer layers, roughness, microstructure, resistivity, fabrication
Ключевые слова: presentation, HTS, coated conductors, economic analysis, IBAD process, co-evaporation process, critical caracteristics, critical current density, thickness dependence, magnetic field dependence, substrate Hastelloy, roughness, electropolishing process, template layers, comparison, plans, YBCO
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, MOCVD process, IBAD process, buffer layers, substrate Hastelloy, roughness, critical caracteristics, Jc/B curves, angular dependence, doping effect, microstructure, long conductors, coils pancake, critical current, pilot-scale, homogeneity
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