Ключевые слова: HTS, REBCO, coated conductors, composition, doping, Raman spectroscopy, critical caracteristics, Jc/B curves, experimental results
Jin F., Wang Y., Wang L., Li Y., Zhang L., Huang Y., Huang X., Dai Y., Bai X., Zhao L., Han X., Gao H., Xu S., Cheng Q., Zhang Q., Gu G., Zhou X., Zhou X., Wu Q., Wang N., Dong T., Liao L., Yue M.
Ключевые слова: HTS, Bi2212, bulk, tapes, environmental impact, degradation studies, Raman spectroscopy, resistivity, temperature dependence, microstructure
Ключевые слова: buffer layers, fabrication, manganites, films epitaxial, substrate SrTiO3, PLD process, Raman spectroscopy, HTS, GdBCO, tapes
Ключевые слова: HTS, YBCO, thin films, fabrication, PLD process, mechanical properties, strain effects, size effect, thickness dependence, substrate LaAlO3, substrate SrTiO3, X-ray diffraction, microstructure, Raman spectroscopy, lattice parameter, resistive transition, critical temperature, experimental results
Strbik V., Chromik S., Spankova M., Rosova A., Camerlingo C., Sojkova M., Talacko M., Bareli G., Jung G.
Ключевые слова: HTS, YBCO, thin films, films epitaxial, substrate single crystal, comparison, PLD process, irradiation effects, electron irradiation, defects, Raman spectroscopy, resistive transition, critical caracteristics, critical current, temperature dependence, oxygen, composition, electron diffraction, microstructure
Ключевые слова: HTS, REBCO, coated conductors, measurement technique, Raman spectroscopy, X-ray diffraction, MOCVD process, control systems
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