Ключевые слова: cylinders, bulk, current density, distribution, numerical analysis, transport currents, angular dependence, magnetic field dependence
Ключевые слова: HTS, Bi2223, tapes multifilamentary, transport currents, fabrication, PIT process, phase formation, gas treatments, X-ray diffraction, composition, oxygenation treatments, microstructure, critical characteristics, critical current, magnetic field dependence, pinning force, experimental results
Ключевые слова: pnictides, wires, tapes, fabrication, PIT process, critical characteristics, grain structure, microstructure, X-ray diffraction, mechanical treatment, critical current density, transport currents, magnetic field dependence, Jc/B curves, pinning force, angular dependence, mechanical properties, stress effects, strain effects, ac losses, long conductors, joints superconducting , review
Ключевые слова: power equipment, HTS, YBCO, coated conductors, quench propagation, recovery characteristics, dc performance, FCL resistive, thermal properties, modeling, numerical analysis, protection layer Ag, resistivity, thermal conductivity, specific heat, temperature dependence, temperature distributions, substrate Ni-W, Cu-based conductors, stabilizing layers, voltage distribution, stainless steel, transport currents
Ключевые слова: HTS, coated conductors, transport currents, grain structure, grain boundaries, PLD process, microstructure, magnetic field distribution, substrate Ni-W, substrate stainless steel, critical characteristics, Jc/B curves, peak effect, angular dependence, vortex structures, experimental results
Ключевые слова: HTS, Bi2223/Ag, tapes, capacitor, ac losses, transport currents, frequency dependence, fabrication
Ключевые слова: MgB2/Nb/Monel, tapes, fabrication, ex-situ process, precursors, powder processing, sintering, critical characteristics, X-ray diffraction, grain size, size effect, critical characteristics, current-voltage characteristics, critical current density, thickness dependence, transport currents, magnetic field dependence, susceptibility, temperature dependence, microstructure
Larbalestier D.C., Kim S., Kim K., Kim K., Noguchi S., Hahn S., Hu X., Jaroszynski J., Dixon I., Bhattarai K.R., Painter T.
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