Ключевые слова: presentation, HTS, YBCO, coated conductors, critical caracteristics, pinning force, microstructure, defects, nanoscaled effects, grain boundaries, nanodots, nanorods, Jc/B curves, critical current density, angular dependence, resistivity, magnetic field dependence, irreversibility fields, magnetic properties, upper critical fields, thickness dependence, irradiation effects, proton irradiation, ion irradiation, doping effect, experimental results
Amemiya N., Jiang Z., Caplin A.D., Buckley R.G., Long N.J., Staines M., Thakur K.P., Badcock R.A., Lakshmi L.S., Hamilton K., Wright A., Sidorov G.N.
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, critical caracteristics, critical current, angular dependence, homogeneity, long conductors, doping effect, coils, economic analysis, planarization, roughness, solution techniques, microstructure, magnetic field dependence, temperature dependence, Jc/B curves, flux creep, pinning, experimental results
Matias V., Maiorov B., Moeckly B., Coulter Y., Sheehan C., Yung C., Glyantsev V., Ruby W., Huh J., Turner P.
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, solution techniques, planarization, long conductors, co-evaporation process, critical caracteristics, critical current, critical current density, n-value, Jc/B curves, angular dependence, pinning, substrate Hastelloy, fabrication
Ключевые слова: power equipment, HTS, review, FCL inductive, core saturated, current limiting characteristics, Bi2223, tapes, YBCO, coated conductors, FCL three-phase, coils bifilar, transformers, hybrid systems, ac losses, current-voltage characteristics, design parameters, power equipment, presentation
Selvamanickam V., Hazelton D., Langston J., Steurer M., Bogdan F., Llambes J.C., Majkic G., Kesgin I., Duval J., Albertini M., Repnoy S., Hauer J., Crook D., Ranner S., Williams T., Coleman M.
Ключевые слова: patents, current leads, design
Ключевые слова: review, energy demand, losses, critical caracteristics, Jc/B curves, critical current, critical temperature, presentation
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