Ключевые слова: power equipment, FCL inductive, dc performance, HTS, YBCO, thin films, experimental results, current limiting characteristics, FCL flux-coupling
Huhtinen H., Golmar F., Acha C., Sanca G.A., Barella M., Alurralde M., Marlasca F.G., Paturie P., Levy P.
Ключевые слова: HTS, EuBCO, doping, PLD process, IBAD process, coated conductors, films epitaxial, fabrication, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves, anisotropy, pinning
Ключевые слова: calorimetric method, cryogenic systems, refrigerator, shielding effects, LTS, NbTi, films, laminations, HTS, YBCO, thin films, cooling technology, coils
Ключевые слова: HTS, films, shielding current density, crack formation, modeling computational
Valladares L.D., Barnes C.H., Cornejo H.S., Dominguez A.B., Osorio.Anaya A.M., Santibanez J.F., Sovero L.S.
Ключевые слова: HTS, YBCO, thin films, microwave devices, impedance, measurement technique, substrate sapphire, meander
Ключевые слова: thin films, PLD process, substrate SrTiO3, GdBCO, coated conductors, IBAD process, ion irradiation, irradiation effects, defects columnar, microstructure, critical caracteristics, critical current, angular dependence, anisotropy, critical current density, n-value, magnetic field dependence, X-ray diffraction, experimental results, HTS, YBCO
Ключевые слова: LTS, Nb3Sn, films, fabrication, high rate process, economic analysis
Wang H., Zhang Y., Haugan T., Zhang D., Huang J., Wu J., Sebastian M.A., Jian J., Gautam B., Ogunjimi V.
Ключевые слова: Nb, films, optical imaging, flux density, distribution, plates, critical current, connectivity
Ключевые слова: HTS, Bi2212, thin films, nanodoping, nanoscaled effects, nanoparticles, fabrication, sol gel process, texture, X-ray diffraction, microstructure, grain size, resistivity, resistive transition, critical temperature, critical caracteristics, Jc/B curves, critical current density, composition, pinning force, temperature dependence, experimental results
Ключевые слова: chalcogenide, FeSeTe, coated conductors, PLD process, IBAD process, RABITS process, substrate Hastelloy, template layers, thin films, substrate single crystal, comparison, X-ray diffraction, lattice parameter, resistive transition, magnetization, temperature dependence, critical caracteristics, Jc/B curves, microstructure, fabrication, experimental results
Ключевые слова: YBCO, thin films, fabrication, spin coating process, substrate Si, Raman spectroscopy
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