Wang H., Zhang Y., Haugan T., Zhang D., Huang J., Wu J., Sebastian M.A., Jian J., Gautam B., Ogunjimi V.
Ключевые слова: HTS, Bi2212, films, fabrication, sol gel process, substrate LaAlO3, substrate SrTiO3, microstructure, surface, roughness, resistivity, temperature dependence, resistive transition, magnetic field dependence, irreversibility fields, critical temperature, X-ray diffraction, experimental results
Puig T., Palau A., Obradors X., Larbalestier D., Jaroszynski J., Abraimov D., Valles F., Mundet B., Constantinescu A.
Ключевые слова: MgB2, thin films, fabrication, PLD process, in-situ process, annealing process, magnetization, resistivity, temperature dependence, X-ray diffraction, Jc/B curves
Ключевые слова: HTS, EuBCO, thin films, surface, polishing process, critical current, anisotropy, microstructure, resistance, temperature dependence
Ключевые слова: HTS, GdBCO, films, ion irradiation, helium, hydrogen, irradiation effects, defects, critical state model, critical current, homogeneity, numerical analysis
Strbik V., Chromik S., Spankova M., Rosova A., Camerlingo C., Sojkova M., Talacko M., Bareli G., Jung G.
Ключевые слова: HTS, YBCO, thin films, films epitaxial, substrate single crystal, comparison, PLD process, irradiation effects, electron irradiation, defects, Raman spectroscopy, resistive transition, critical caracteristics, critical current, temperature dependence, oxygen, composition, electron diffraction, microstructure
Holzapfel B., Hanisch J., Awaji S., Iida K., Driessche I.V., Erbe M., Okada T., Cayado P., Rijckaert H.
Ключевые слова: HTS, GdBCO, thin films, chemical solution deposition, fabrication, doping effect, nanoparticles, nanoscaled effects, pinning mechanism, substrate SrTiO3, microstructure, resistive transition, irreversibility fields, critical caracteristics, Jc/B curves, pinning force, n-value, critical current density, angular dependence, experimental results
Ключевые слова: Bi2212, films, fabrication, electrophoretic deposition, stability, X-ray diffraction, critical temperature, resistive transition, microstructure, HTS
Ключевые слова: HTS, YBCO, films epitaxial, fabrication, substrate LaAlO3, powder processing, precipitation methods, optical imaging, microstructure, X-ray diffraction
Schneider M., Vertelis V., Balevicius S., Stankevic V., Zurauskiene N., Simkevicius C., Stankevic T., Plausinaitiene V., Tolvaisiene S.
Ключевые слова: HTS, YBCO, Y_YbBCO, YSmBCO, films, PLD process, substrate SrTiO3, fabrication, growth rate, pinning, targets, phase diagram, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves
Puig T., Obradors X., Ricart S., Mocuta C., Pino F., Banchewski J., Queraltу A., Pacheco A., Gupta K., Saltarelli L., Garcia D., Alcalde N.
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