Aytug T., Christen D.K., Feenstra R., Zhang Y.(zhanngyf@utk.edu), ParansParanthaman M.
Ключевые слова: HTS, YBCO, films, substrate single crystal, precursors, TFA-MOD process, fluorine process, Jc/B curves, fabrication, experimental results, critical caracteristics
Ключевые слова: HTS, YBCO, films large-area, substrate sapphire, buffer layers, MOD process, critical current density, fabrication, critical caracteristics
Yoshida Y., Osamura K., Matsumoto K., Horii S., Mukaida M., Ichinose A., Takahara D.(takahara@hightc.mtl.kyoto-u.ac.jp), Horide T.(horide@hightc.mtl.kyoto-u.ac.jp)
Ключевые слова: HTS, PLD process, substrate SrTiO3, coated conductors, films epitaxial, microstructure, Jc/B curves, critical caracteristics, fabrication
Yoshida Y., Matsumoto K., Ichino Y., Horii S., Mukaida M., Ichinose A., Miura M.(m-miura@ees.nagoya-u.ac.jp), Takai Y.(takai@nuee.nagoya-u.ac.jp)
Ключевые слова: HTS, REBCO, PLD process, seed layers, REBCO, films, microstructure, susceptibility, temperature dependence, fabrication, magnetic properties
Choi M., Iluyshechkin A., Agranovski I.E.(i.agranovski@griffith.edu.au), Altman I.S., Racha N.
Ключевые слова: HTS, Bi2212, films thick, fabrication, nanodoping, grain alignment, substrate Ag, Jc/B curves, temperature dependence, microstructure, critical caracteristics
Puig T., Obradors X., Pomar A., Sandiumenge F., Pinol S., Mestres N., Castano O., Coll M., Gazquez J., Gonzalez J.C.
Ignatiev A., Zhang X., ZENG J.(jmzeng@svec.uh.edu), Rusakova I., Tang Z., Sanchez D., MOLODYK A., Wu N.
Ключевые слова: HTS, YBCO, films thick, MOCVD process, growth rate, coated conductors, fabrication
Ключевые слова: HTS, REBCO, films thick, substrate single crystal, buffer layers, fabrication, microstructure
Ключевые слова: HTS, YBCO, buffer layers, films epitaxial, substrate Ni, coated conductors, RABITS process, fabrication
Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Yoshida Y.(yoshida@nuee.nagoya-u.ac.jp), Miura M.
Nakamura T., Murakami K.(b99t3064@maxwell.ele.tottori-u.ac.jp), Yasuike S., Tokuda T., Kishida S.
Ключевые слова: HTS, Bi2212, films thick, substrate Ni, buffer layers, substrate Ag, chemical solution deposition, resistance, temperature dependence, fabrication
Kiuchi M., Wada H., Matsushita T.(matusita@cse.kyutech.ac.jp), Yasuda T., Uchiyama T., Iguchi I.
Su J.H.(Jianhua.su@wright.edu), Joshi P.P., Chintamaneni V., Mukhopadhyay S.M.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, heating rates, TFA-MOD process, microstructure, resistivity, temperature dependence, fabrication
Specht E.D., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Kang S., List F.A., Martin P.M., Varela M., Pennycook S.J., Ijaduola A.O., Gapud A.A., Goyal A.(goyala@ornl.gov)
Ключевые слова: HTS, YBCO, films, nanodots, defects columnar, pinning, microstructure, Jc/B curves, anisotropy, fabrication, experimental results, critical caracteristics
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