Specht E.D., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Kang S., List F.A., Martin P.M., Varela M., Pennycook S.J., Ijaduola A.O., Gapud A.A., Goyal A.(goyala@ornl.gov)
Ключевые слова: HTS, YBCO, films, nanodots, defects columnar, pinning, microstructure, Jc/B curves, anisotropy, fabrication, experimental results, critical caracteristics
Yamasaki H., Nakagawa Y., Nie J.C., Murugesan M., Mawatari Y., Develos-Bagarinao K.(develos-bagarinao@aist.go.jp)
Osamura K., Nakao-Kametani F.(fumi.nakao@materials.mbox.media.kyoto-u.ac.jp)
Ключевые слова: HTS, Bi2223/Ag, tapes, phase formation, heat treatment, microstructure, fabrication, critical current density, critical caracteristics
Otto A.(aotto@amsuper.com), Harley E.J., Mason R.
Osamura K., Semerad R., Itoh K., Prusseit W., Kiyoshi T., Sugano M.(sugano@kuee.kyoto-u.ac.jp)
Ключевые слова: HTS, YBCO, REBCO, REBCO, coated conductors, substrate Hastelloy, tensile tests, fracture behavior, ISD process, buffer layers, mechanical properties, critical current, strain effects, stress effects, microstructure, quench properties, fabrication, experimental results, critical caracteristics
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, defects, pinning, quench, microstructure, Jc/B curves, temperature dependence, pinning force, experimental results, critical caracteristics
Arendt P.N., Foltyn S.R., Jia Q.X., Li Y., Zhang X., Wang H.(wangh@lanl.gov)
Guclu N.(guclu06@hotmail.com), Kolemen U., Uzun O., Celebi S.
Ключевые слова: HTS, YBCO, bulk, mechanical properties, cryogenic systems, hardness, elastic behavior, microstructure, temperature dependence, experimental results
McCrary K.E., Jongprateep O., Dogan F.(doganf@umr.edu), Strasik M.(michael.strasik@boeing.com)
Ключевые слова: HTS, YBCO, bulk, doping effect, microstructure, critical current density, fabrication, critical caracteristics
Ma B., Koritala R.E., Fisher B.L., Dorris S.E., Miller D.J., Balachandran U., Maroni V.A., Uprety K.K.
Rupich M.W., Thieme C., Li X., Kodenkandath T., Goyal A., Paranthaman M., Aytug T., Christen D.K., Budai J.D., Cantoni C., Gapud A.A., Schoop U.(uschoop@amsuper.com), Kim K.(kyz@ornl.gov)
Ключевые слова: HTS, coated conductors, substrate Ni, buffer layers, chemical solution deposition, microstructure, texture, fabrication
Ключевые слова: HTS, coated conductor modules, substrate Ni-W, buffer layers, MOD process, texture, microstructure, films epitaxial, fabrication
Barnes P.N., Sathiraju S.(srinivas.sathiraju@wpafb.af.mil), Varanasi C.(chakrapani.varanasi@wpafb.af.mil), Wheeler R.(robert.wheeler@wpafb.af.mil)
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, buffer layers, IBAD process, microstructure, texture, fabrication
Ключевые слова: HTS, coated conductors, buffer layers, ISD process, surface, microstructure, substrate Hastelloy, PLD process, thickness dependence, angular dependence, fabrication
Kumakura H., Nakane T., Jiang C.H.(jiang.chunhai@nims.go.jp)
Ключевые слова: HTS, PIT process, critical current density, Jc/B curves, microstructure, fabrication, experimental results, critical caracteristics
Chen J., Li Q., Mielke C.H., Pogrebnyakov A.V., Xi X.X., Redwing J.M., Ferrando V., Giencke J.E., Orgiani P., Eom C., Feng Q., Betts J.B.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, nanodoping, PLD process, microstructure, Jc/B curves, fabrication, experimental results, critical caracteristics
Kim H.-J., Kim C.-J., Jun B.-H.(bhjun@kaeri.re.kr), Choi J.-K.
Weiss F., Bruzek C.E., Vergnieres L.(laura.vergnieres@inpg.fr), Donet S.(sebastien.donet@inpg.fr), Jimenez C.(carmen.jimenez@inpg.fr), Odier P.(odier@grenoble.cnrs.fr), Saugrain J.M.(Jean_Maxime.Saugrain@nexans.com)
Ключевые слова: HTS, YBCO, coated conductors, substrate CeO2/IBAD-YSZ/Ni alloy, MOCVD process, spray pyrolysis process, fabrication, microstructure
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