Izumi T., Yamada Y., Sakai N., Miyata S., Nakao K., Konishi M., Chikumoto N., Shiohara Y.(shiohara@istec.or.jp), Tajima S., Kato J.Y.(yoshioka@istec.or.jp)
Ключевые слова: HTS, coated conductor modules, YBCO, joints, diffusion method, stabilizing layers, joint resistances, experimental results
Nagaya S., Sumiyoshi F., Kawagoe A.(kawagoe@eee.kagoshima-u.ac.jp), Hirano N.(hirano.naoki@chuden.co.jp), Kawabata Y.
Ключевые слова: HTS, Bi2212, interstrand contact resistances, Rutherford cables, SMES, power equipment
Ghosh A.K.(aghosh@bnl.gov), Soika R.
Ключевые слова: LTS, Rutherford cables, interstrand contact resistances, experimental results, NbTi, power equipment
Barnes P.N., Haugan T.J., Levin G.A., Wang L.B., Price M.B., Young J.L., Kwon C.(ckwon@csulb.edu)
Ключевые слова: HTS, YBCO, films, current distribution, resistance, coated conductors multifilamentary, RABITS process, experimental results, fabrication, striations
Carvalho C.L.(carvalho@fqm.feis.unesp.br), Yukimitu K.(carvalho@fqm.feis.unesp.br), Reynoso V.C.(carvalho@fqm.feis.unesp.br), Moraes J.C.S.(carvalho@fqm.feis.unesp.br), Araujo E.B.(carvalho@fqm.feis.unesp.br), Alves N., Rainho S.
Ключевые слова: HTS, Bi2223, bulk, phase formation, resistance, magnetization, temperature dependence, fabrication, magnetic properties
Ключевые слова: HTS, YBCO, films, meander, substrate sapphire, resistance, time evolution, quench properties, FCL resistive, experimental results, power equipment
Utz B., Kraemer H.-P., Neumueller H.-W., Schmidt W.(wolfgang.schmidt@siemens.com), Wacker B., Ahlf G., Hartig R.(reiner.hartig@siemens.com)
Ключевые слова: FCL resistive, HTS, YBCO, films, substrate sapphire, meander, nitrogen liquid , voltage waveforms, resistance, time evolution, thermal performance, quench current, test results, dc performance, power equipment
Ключевые слова: FCL resistive, YBCO, films, heterostructures, substrate sapphire, meander, resistance, time evolution, dissipative properties, test results, power equipment, new
Matsumura T., Shimizu H., Yokomizu Y., Mutsuura K.(k_mutsuura@echo.nuee.nagoya-u.ac.jp)
Ключевые слова: FCL resistive, quench properties, HTS, YBCO, films, substrate sapphire, meander, resistance, time evolution, experimental results, power equipment, quench protection
Matsumura T., Shimizu H., Murayama N., Aritake T., Yokomizu Y.(yokomizu@nuee.nagoya-u.ac.jp)
Murakami M., Sawa K., Tomita M., Hirabayashi I., Sakai N., Imaizumi T.(imataku@sum.sd.keio.ac.jp)
Nakamura T., Murakami K.(b99t3064@maxwell.ele.tottori-u.ac.jp), Yasuike S., Tokuda T., Kishida S.
Ключевые слова: HTS, Bi2212, films thick, substrate Ni, buffer layers, substrate Ag, chemical solution deposition, resistance, temperature dependence, fabrication
Zettl A., Huang X.(xhuang@berkeley.edu), Mickelson W., Regan B.C.
Ключевые слова: HTS, Bi2212, bulk, texture, microstructure, hot spots, defects, resistance, time evolution, microstructure, experimental results
Togano K., Nishijima G., Awaji S., Watanabe K., Tasaki K., Kuriyama T., Ono M., Takano H., Hanai S., Takigami H., Kyoto M.
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