Ключевые слова: SMES, HTS, Bi2223/Ag, tapes, coils, winding configurations, modeling, numerical analysis, power equipment
Hawley C.J.(hawley@uow.edu.au), Gower S.A.(steveg@uow.edu.au)
Ключевые слова: SMES, HTS, Bi2223, tapes, coils, cryocoolers, prototype, current-voltage characteristics, design parameters, test results, power equipment, critical caracteristics
Tixador P., Bruzek C.E., Saugrain J.M., Bellin B., Deleglise M.(marc.deleglise@grenoble.cnrs.fr), Vallier J.C., Pavard S.
Ключевые слова: SMES, HTS, Bi2212, tapes, coils pancake, cryocoolers, design parameters, test results, critical current, stress effects, thermal properties, power equipment, critical caracteristics
Kim J.H., Hahn S.-Y., Kim W.-S.(otto@kpu.ac.kr), Lee J.M.(zzugumi@pesl.snu.ac.kr), Rue M.H.(nanta97@snu.ac.kr), Cho B.H.(bhcho@snu.ac.kr), Im C.H.(ichism@elecmech.snu.ac.kr), Jung H.K.(hkjung@snu.ac.kr)
Ключевые слова: SMES, model small-scale, HTS, coils pancake, Bi2223, tapes, cryocoolers, test results, power equipment
Kasahara H., Akita S., Tatsuta Y., Kouso S., Noguchi S.(noguchi@ssi.ist.hokadai.ac.jp), Ishiyama A.(atsushi@waseda.jp)
Fang J., Gu C., Han Z., Alamgir A.K.M.(alam643@hotmail.com)
Ключевые слова: HTS, tapes, measurement technique, ac losses, anisotropy
Ключевые слова: HTS, Bi2223, tapes, ac losses, frequency dependence, measurement technique, MRI magnets, coils, medical applications, resonance effects
Gu C., Han Z., Alamgir A.K.M.(alam643@yahoo.com)
Haken B., Kiuchi M., Itoh K., Goldacker W., Katagiri K., Noto K., Ochiai S., Kuroda T.(kuroda.tsuneo@nims.go.jp), Haessler W., Otabe S., Shin H.S.*10, Sosnowski J.*11, Weijers H.*12, Wada H.*13, Kumakura K.
Dou S.X., Pan A.V., Roussel M.(roussel@uow.edu.au), Zeng R.
Ключевые слова: HTS, Bi2223/Ag, tapes multifilamentary, heat treatment, fabrication, optical imaging, microstructure, crack formation, grain structure, magnetization curves, temperature dependence, critical current, transport currents, experimental results, critical caracteristics, magnetic properties
Flukiger R., Lezza P., Uglietti D., Abacherli V., Pollini A., Eckert D., Seeber B.(bernd.seeber@physics.unige.ch), Bovier P.-A., Kubler G.
Ключевые слова: measurement setup, critical current, strain effects, wires, tapes, LTS, Nb3Sn, HTS, Bi2223, n-value, experimental results, critical caracteristics, length
Dutoit B., Stavrev S., Grilli F.(fgrilli@lanl.gov), Ashworth S.P.
Kumakura H., Nakane T.(NAKANE.Takayuki@nims.go.jp), Fujii H., Kuroda T., Jiang C.H., Mochiku T.
Ключевые слова: MgB2, precursors, nanodoping, tapes, fabrication, PIT process, critical current density, microstructure, critical caracteristics
Lehtonen J., Mikkonen R., Masti M.(mika.masti@tut.fi)
Ключевые слова: HTS, tapes, measurement technique, Bi2223/Ag, ac performance, Hall sensor, annealing process, numerical analysis, fabrication
Nakamura T., Okamoto H., Higashikawa K.(kohei@asl.kuee.kyoto-u.ac.jp)
Perner O., Fischer C., Baunack S.(s.baunack@ifw-dresden.de)
Ключевые слова: MgB2, PIT process, microstructure, tapes, composition, fabrication
Ключевые слова: HTS, Bi2223/Ag, tapes monofilamentary, texture, deformation, fabrication
Weber H.W., Eisterer M.(eisterer@ati.ac.at), Krutzler C.
Schwartz J., Zhang G., Nguyen D.N.(nguyen@caps.fsu.edu), Sastry P.V.P.S.S., Knoll D.C.
Han Z., Liu Q., Andersen N.H., Chen X.P., Qu T.M., Li M.Y., Grivel J.-C.(jean-claude.grivel@risoe.dk)
Ключевые слова: HTS, Bi2223/Ag, tapes monofilamentary, phase formation, fabrication, microstructure
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