Ключевые слова: switches, HTS, YBCO, films, substrate sapphire, dc performance, quench properties, normal zone propagation, voltage drops, experimental results, ac performance
Matsumura T., Kado H., Ichikawa M., Shibuya M., Kojima M.(kojimam@dowa.co.jp), Kawahara M.
Nakamura T., Muta I., Hoshino T., Yamada M., Salim K.M.(khosru@iub.edu.bd)
Ключевые слова: FCL rectifier type, HTS, tapes, coils, current waveforms, voltage waveforms, numerical analysis, power equipment
Ключевые слова: FCL inductive, modeling, current waveforms, voltage waveforms, HTS, Bi2212, bulk, tubes, experimental results, numerical analysis, power equipment
Langston J., Steurer M., Woodruff S.(woodruff@caps.fsu.edu), Baldwin T., Tang J.(tang@@eng.fsu.edu)
Ключевые слова: FCL inductive, LTS, NbTi, voltage waveforms, current waveforms, power transmission lines, test results, power equipment
Nitta T., Oide T., Chiba M., Shirai Y., Mochida A., Shiotsu M., Morimoto T.(morimoto@pe.energy.kyoto-u.ac.jp)
Ключевые слова: FCL three-phase, LTS, coils, recovery characteristics, test results, switching process, current waveforms, voltage waveforms, power equipment
Matsumura T., Shimizu H., Murayama N., Aritake T., Yokomizu Y.(yokomizu@nuee.nagoya-u.ac.jp)
Iijima Y., Awaji S., Watanabe K., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Izumi T., Shiohara Y., Inoue M., Kakimoto K., Matsuda J., Sawa H., Tsuda Y.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Ajimura S.(sajimura@fujikura.co.jp)
Ключевые слова: HTS, coated conductors, buffer layers, IBAD process, YBCO, PLD process, reel-to-reel process, long conductors, coils, critical current, thickness dependence, critical current distribution, homogeneity, current-voltage characteristics, upper critical fields, critical caracteristics, fabrication, power equipment, substrate Hastelloy, magnetic properties
Usoskin A., Rutt A., Knoke J.(jknoke@gwdg.de), Krauth H.(Helmut.Krauth@advancedsupercon.com), Arndt T.J.(Thomas.Arndt@advancedsupercon.com)
Rupich M.W., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Goyal A., Paranthaman M., Verebelyi D.T., Civale L., Maiorov B., Holesinger T.
Rupich M.W., Thieme C.L., Schoop U., Li X., Zhang W., Kodenkandath T., Goyal A., Verebelyi D.T., Paranthaman M.P., Sathyamurthy S., Bhuiyan M.S.
Park C., Hong G.-W., Lee H.-G., Shin G.-M.(shin77@snu.ac.kr), Wee S.-H., Song K.-J., Moon S.-H., Yoo S.-I.
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