Ключевые слова: HTS, YBCO, REBCO, films epitaxial, critical caracteristics, Jc/B curves, temperature dependence, pinning, co-evaporation process, MOD process, fluorine-free process, dislocations, microstructure, nanoscaled effects, angular dependence, experimental results, substrate single crystal, buffer layers
Ключевые слова: HTS, YBCO, coated conductors, critical caracteristics, angular dependence, pinning, commercialization, MOCVD process, magnetic field dependence
Sohma M., Yamaguchi I., Kondo W., Tsukada K., Kumagai T., Yamasaki H., Arai K., Manabe T., Matsui H.
Ключевые слова: HTS, YBCO, films, substrate sapphire, FCL resistive, protection layers, fabrication, experimental results, power equipment
Ключевые слова: HTS, YBCO, films, fluorine-free process, MOD process, substrate sapphire, substrate single crystal, defects, stacking fault, pinning, co-evaporation process, critical caracteristics, Jc/B curves, angular dependence, critical current density, microstructure, fabrication, experimental results
Ayai N., Funaki K., Iwakuma M., Fukumoto Y., Kato T., Tomioka A., Bohno T., Kamijo H., Hata H., Yamada H., Yamasaki K.
Izumi T., Shiohara Y., Funaki K., Iwakuma M., Yamada Y., Saito T., Nakao K., Kato J., Tanabe K., Yamasaki S., Chikumoto T.
Higuchi N., Sohma M., Yamaguchi I., Kondo W., Kumagai T., Yamasaki H., Nakagawa Y., Kaiho K., Arai K., Matsui H., Natori N.
Ключевые слова: HTS, YBCO, films large-area, MOD process, substrate sapphire, FCL resistive, matrix, shunt, short circuit test, high voltage process, power equipment
Otabe E.S., Yamada H., Yamasaki H., Mawatari Y., Minakuchi T., Nakagawa S., Kanayama K., Hirachi K., Furuta T., Takegami K.
Ключевые слова: measurement technique, HTS, YBCO, REBCO, films, current-voltage characteristics, critical caracteristics, harmonics impact
Ключевые слова: HTS, YBCO, films, FCL resistive, shunt, normal zone propagation, overcurrent, temperature distribution, experimental results, power equipment
Yamamoto T., Mawatari Y., Yamada H.(yamada@maizuru-ct.ac.jp), Minakuchi T., Itoh D., Nakagawa S., Kanayama K., Hirachi K., Yamasaki H.(hyamasak@etl.go.jp)
Ключевые слова: HTS, YBCO, films large-area, critical current density, measurement technique, critical caracteristics, harmonics impact
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