Wang H., Haugan T., Chen S., Huang J., Wu J., Sebastian M.A., Baca J., Gautam B., Xing Z., Osofsky M., Prestigiacomo J., Mishra S.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Pompeo N., Angrisani A.A., Sotgiu G., Pinto V., Piperno L., Frolova A., Santoni A., Rondino F.
Ключевые слова: MgB2, thin films, carbon, ion irradiation, irradiation effects, X-ray diffraction, critical characteristics, upper critical fields, heat treatment, annealing process, substrate single crystal, HPCVD process, resistive transition, magnetization, critical temperature, attice parameter, Jc/B curves, experimental results
Ключевые слова: HTS, YBCO, precursors, chemical solution deposition, fabrication, substrate LaAlO3, thin films, flux density, microstructure
Ключевые слова: news, levitation performance, fusion, spheres, modeling, MgB2, thin films, magnets permanent, contact characteristics
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Barba L., Arrighetti G., Campi G.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Torokhtii K., Frolova A.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, fabrication, nanodoping, critical characteristics, pinning, measurement technique, critical current density, microwave devices, Jc/B curves, pinning force, angular dependence, surface impedance, magnetic field dependence, nitrogen liquid , experimental results
Ключевые слова: pinning centers artificial, nanoscaled effects, nanocomposites, nanorods, nanoparticles, X-ray diffraction, microstructure, critical characteristics, critical current density, Jc/B curves, angular dependence, pinning force, fabrication, experimental results, HTS, YBCO, thin films, PLD process, substrate SrTiO3
Kus P., Plecenik A., Gregor M., Plecenik T., Sobota R., Roch T., Satrapinskyy L., Svec P., Girman V., Kacmarcik J.
Ключевые слова: MgB2, thin films, fabrication, oxygenation treatments, argon, annealing process, resistive transition, resistivity, temperature dependence, critical characteristics, critical current density, magnetic field dependence, upper critical fields, anisotropy, microstructure, X-ray diffraction, experimental results
Kus P., Plecenik A., Gregor M., Plecenik T., Roch T., Satrapinskyy L., Svec P., Caplovicova M., Bystricky R.
Ключевые слова: MgB2, thin films, fabrication, co-evaporation process, ex-situ process, annealing process, oxygenation treatments, argon, X-ray diffraction, texture, microstructure
Eisterer M., Sokolovsky V., Prikhna T.A., Moshchil V.E., Seidel P., Shapovalov A.P., Shaternik V.E., Kovylaev V.V., Shaternik A.V., Romaka V.V., Ponomaryov S.S.
Ключевые слова: NbN, LTS, thin films, ion irradiation, oxygen, measurement technique, thickness dependence, microstructure
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