Wang H., Haugan T., Chen S., Huang J., Wu J., Sebastian M.A., Baca J., Gautam B., Xing Z., Osofsky M., Prestigiacomo J., Mishra S.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Pompeo N., Angrisani A.A., Sotgiu G., Pinto V., Piperno L., Frolova A., Santoni A., Rondino F.
Ключевые слова: MgB2, thin films, carbon, ion irradiation, irradiation effects, X-ray diffraction, critical characteristics, upper critical fields, heat treatment, annealing process, substrate single crystal, HPCVD process, resistive transition, magnetization, critical temperature, attice parameter, Jc/B curves, experimental results
Ключевые слова: HTS, YBCO, precursors, chemical solution deposition, fabrication, substrate LaAlO3, thin films, flux density, microstructure
Ключевые слова: MgB2, thin films, irradiation effects, ion irradiation, carbon, critical characteristics, HPCVD process, substrate sapphire, X-ray diffraction, lattice parameter, resistive transition, RRR parameter, critical temperature, Jc/B curves, irreversibility fields, pinning force, fabrication, experimental results
Ferdeghini C., Braccini V., Putti M., Ghigo G., Gozzelino L., Pallecchi I., Pace S., Grimaldi G., Leo A., Nigro A., Martinelli A., Bellingeri E., Torsello D., Sylva G., Pellegrino L.
Ключевые слова: thin films, substrate SrTiO3, PLD process, pinning, pinning centers artificial, angular dependence, defects columnar, size effect, nanoscaled effects, vortex dynamics, lattice parameter, critical temperature, critical characteristics, critical current density, Jc/B curves, pinning force, experimental results, HTS, YBCO
Wang H., Haugan T., Huang J., Wu J., Sebastian M.A., Baca J., Gautam B., Osofsky M., Prestigiacomo J., Misra S., Ogunjimi V.
Ключевые слова: HTS, YBCO, nanocomposites, thin films, PLD process, substrate SrTiO3, pinning centers artificial, nanoscaled effects, interfaces, dislocations, X-ray diffraction, lattice parameter, pinning force, critical temperature, microstructure, critical characteristics, Jc/B curves, critical current density, angular dependence, experimental results
Zhang W., Wang H., Haugan T.J., Wu J.Z., Susner M.A., Huang J., Sebastian M.A., Gautam B., Ebbing C.R., Panasyuk G.Y.
Ключевые слова: HTS, YBCO, doping effect, phase composition, thin films, PLD process, substrate SrTiO3, nanoscaled effects, microstructure, critical characteristics, Jc/B curves, fabrication, temperature dependence, substrates, composition, pinning force, critical current density, X-ray diffraction, experimental results
Ключевые слова: HTS, thin films, coated conductors, geometry effects, measurement technique, Hall sensor, critical current density, distribution, defects, critical characteristics, current-voltage characteristics, critical current distribution, magnetic field distribution, experimental results, numerical analysis
Porokhov N.V., Chukharkin M.L., Maresov A.G., Snigirev O.V., Levin E.E., Kalaboukhov A.S., Zenova E.V.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate single crystal, buffer layers, magnetron sputtering, X-ray diffraction, phase composition, microstructure, current-voltage characteristics, temperature dependence, resistive transition, magnetic field dependence, activation energies, critical characteristics, critical current, flux flow, upper critical fields, experimental results
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