Goyal A., Paranthaman M., Aytug T., Christen D.K., Leonard K.J., Thompson J.R., Martin P.M., Zhai H.Y., Gapud A.A.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, seed layers, barriers, oxygen diffusion, Jc/B curves, fabrication, critical caracteristics
Rupich M.W., Thieme C., Li X., Kodenkandath T., Goyal A., Paranthaman M., Aytug T., Christen D.K., Budai J.D., Cantoni C., Gapud A.A., Schoop U.(uschoop@amsuper.com), Kim K.(kyz@ornl.gov)
Schmidt J., Wahl G., Gorbenko O.Y., Kaul A.R., Stadel O.(o.stadel@tu-braunschweig.de), Samoilenkov S.V., Keune H., Melnikov O.V.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, reel-to-reel process, buffer layers, MOCVD process, texture, fabrication
Goyal A., Aytug T., Christen D.K., Paranthaman M.P., Cantoni C., Gapud A.A., Kim K.(kkim@mse.ufl.edu), Norton D.P.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, PLD process, substrate SrTiO3, texture, resistivity, temperature dependence, fabrication
Ключевые слова: HTS, coated conductors, substrate Ni, buffer layers, chemical solution deposition, microstructure, texture, fabrication
Ключевые слова: HTS, coated conductor modules, substrate Ni-W, buffer layers, MOD process, texture, microstructure, films epitaxial, fabrication
Barnes P.N., Sathiraju S.(srinivas.sathiraju@wpafb.af.mil), Varanasi C.(chakrapani.varanasi@wpafb.af.mil), Wheeler R.(robert.wheeler@wpafb.af.mil)
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, buffer layers, IBAD process, microstructure, texture, fabrication
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, substrate single crystal, buffer layers, spin coating process, precursors, heat treatment, texture, fabrication
Ключевые слова: HTS, YBCO, coated conductors, PLD process, buffer layers, RABITS process, substrate Ni-W, texture, films epitaxial, fabrication
Holzapfel B., Kursumovic A., Evetts J.E., Puig T., Obradors X., Pomar A., Sandiumenge F., Cavallaro A., Huhne R.(r.huehne@ifw-dresden.de)
Ключевые слова: HTS, substrate Ni-Mn, surface oxidation, template layers, buffer layers, PLD process, MOD process, fabrication
Ключевые слова: HTS, coated conductors, buffer layers, ISD process, surface, microstructure, substrate Hastelloy, PLD process, thickness dependence, angular dependence, fabrication
Fukuoka K.(kfukuoka@uitec.ac.jp), Hashimoto M.
Murakami M., Sawa K., Iwasa Y., Hirabayashi I., Sakai N., Ito E.(eisuke@sum.sd.keio.ac.jp), Komano Y.
Kumakura H., Nakane T., Jiang C.H.(jiang.chunhai@nims.go.jp)
Ключевые слова: HTS, PIT process, critical current density, Jc/B curves, microstructure, fabrication, experimental results, critical caracteristics
Evetts J.E., Kursumovic A.(ak237@cus.cam.ac.uk), Foltyn S.R., Jia Q.X., Wang H., MacManus-Driscoll J.L., Civale L., Maiorov B.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, nanodoping, PLD process, microstructure, Jc/B curves, fabrication, experimental results, critical caracteristics
Iijima Y., Goto T., Saitoh T., Teranishi R., Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Yoshinaka A., Nakaoka K., Kitoh Y.
Ключевые слова: HTS, YBCO, bulk, mechanical properties, bending process, measurement technique, experimental results
Katagiri K., Fujishiro H.(fujishiro@iwate-u.ac.jp), Noto K., Yoshino Y., Murakami A.
Ключевые слова: HTS, bulk, thermal performance, mechanical properties
Torii S.(torii@ee.musashi-tech.ac.jp), Yuasa K., Nishikawa H.
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.