Awaji S., Watanabe K., Fujiyoshi T., Ikegami T., Ishikawa N., Sueyoshi T., Yonekura K., Sogo T., Mitsugi F.
Ключевые слова: funding, plans, collaborations, HTS, YBCO, current limiting characteristics, coated conductors, MOD process, RABITS process, pinning, defects, grain boundaries, power equipment, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, commercialization, long conductors, fabrication, roughness, planarization, texture, substrate Hastelloy, microstructure, irradiation effects, growth rate, defects, pinning, critical caracteristics, critical current density, angular dependence, Jc/B curves, nanoscaled effects, nanodots, phase composition, defects columnar, homogeneity, critical current, thickness dependence
Ключевые слова: HTS, YBCO, coated conductors, pinning centers artificial, pinning, critical caracteristics, Jc/B curves, microstructure, defects, angular dependence, critical current density, nanodots, nanorods, nanoscaled effects, temperature dependence, magnetic properties, irreversibility fields, upper critical fields, vortex phase diagram, experimental results
Ключевые слова: funding, plans, collaborations, HTS, YBCO, coated conductors, pinning centers, nanodoping, nanoscaled effects, defects columnar, fabrication, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, MOD process, MOCVD process, comparison, microstructure, doping effect, fabrication, defects, nanoscaled effects, critical caracteristics, critical current density, angular dependence, phase composition, Raman spectroscopy, defects columnar, critical current
Ключевые слова: presentation, HTS, YBCO, coated conductors, measurement technique, critical caracteristics, Jc/B curves, angular dependence, critical current density, temperature dependence, pinning, flux creep, defects columnar, phase composition, current-voltage characteristics, grain boundaries, nanoscaled effects, experimental results
Ключевые слова: patents, measurement setup, control systems, defects
Ключевые слова: presentation, HTS, YBCO, coated conductors, current limiting characteristics, critical caracteristics, critical current density, grain boundaries, buffer layers, crack formation, microstructure, magnetic properties, irreversibility fields, angular dependence, MOCVD process, IBAD process, doping effect, Jc/B curves, pinning, defects, stacking fault, anisotropy, pinning force, experimental results
Ключевые слова: presentation, HTS, YBCO, coated conductors, nanoscaled effects, nanodots, microstructure, nanorods, RABITS process, defects columnar
Ключевые слова: presentation, HTS, YBCO, coated conductors, critical caracteristics, pinning force, microstructure, defects, nanoscaled effects, grain boundaries, nanodots, nanorods, Jc/B curves, critical current density, angular dependence, resistivity, magnetic field dependence, irreversibility fields, magnetic properties, upper critical fields, thickness dependence, irradiation effects, proton irradiation, ion irradiation, doping effect, experimental results
Ключевые слова: HTS, YBCO, bulk, single-domain, pinning, nanodoping, nanorods, defects, critical caracteristics, Jc/B curves, pinning force, microstructure, trapped field, experimental results, presentation
Ключевые слова: HTS, YBCO, films, fluorine-free process, MOD process, substrate sapphire, substrate single crystal, defects, stacking fault, pinning, co-evaporation process, critical caracteristics, Jc/B curves, angular dependence, critical current density, microstructure, fabrication, experimental results
Ключевые слова: HTS, YBCO, bulk, disks, infiltration process, defects, nanoscaled effects, pressure dependence, critical caracteristics, Jc/B curves, fabrication
Okayasu S., Sasase M., Kitamura H., Tamegai T., Nakajima Y., Murakami T., Tsuchiya Y., Taen T., Yagyuda H.
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