Kursumovic A., Xu X., MacManus-Driscoll J.L., Dou S.X., Yeoh W.K., Chen S.K., Tan K.Y., De Silva K.S., Halim A.S.
Ключевые слова: HTS, YBCO, REBCO, coated conductors, MOCVD process, review, critical caracteristics, critical current density, critical current, magnetic field dependence, temperature dependence, doping effect, composition, critical temperature, angular dependence, thickness dependence, microstructure, defects, nanoscaled effects, nanorods, economic analysis, presentation
Ключевые слова: HTS, YBCO, films, modeling, nanoscaled effects, nanorods, defects columnar, microstructure, critical current density, pinning, vortex interaction, magnetic field dependence
Ключевые слова: LTS, cable-in-conduit conductor, joints, defects, measurement technique, Nb3Sn, modeling, Hall sensor
Miller D.J., Maroni V.A., Specht E.D., Chen Z., Aytug T., Paranthaman M.P., Zuev Y., Kropf A.J., Zaluzec N.J.
Ключевые слова: joints, LHC, bus bar conductor, defects, accelerator magnets, heat transfer, LTS, NbTi, cables, design parameters, experimental results, high field magnets
Ключевые слова: HTS, power equipment, insulation, defects, cryogenic materials, dielectric properties, discharge characteristics, experimental results
Specht E.D., Yao H., Jia Q.X., MacManus-Driscoll J.L., Maiorov B., Li Q., Solovyov V.F., Haugan T.J., Si W.
Ключевые слова: HTS, YBCO, films thick, strain effects, defects, pinning, synchrotron, X-ray diffraction, nanoscaled effects, nanodoping, nanorods, nanoparticles, PLD process, substrate SrTiO3, substrate LaAlO3, TFA route, buffer layers, critical caracteristics, critical current density, mechanical properties, strain effects, aspect ratios
Ключевые слова: HTS, YBCO, films epitaxial, chemical solution deposition, TFA route, review, coating-pyrolysis process, nucleation, growth rate, fabrication, microstructure, critical caracteristics, nanoscaled effects, defects, pinning, critical current density, heat treatment, angular dependence, Jc/B curves, thickness dependence, substrate LaAlO3, substrate single crystal
Ключевые слова: HTS, YBCO, thin films, patterning, nanoscaled effects, ion irradiation, defects, substrate single crystal, PLD process, resistivity, resistance, anisotropy, microstructure
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