Puig T., Obradors X., Pomar A., Sandiumenge F., Mestres N., Gazquez J., Roma N., Ricart S., Gibert M., Llordes A., Moreno C., Gutierrez T.P.
Ключевые слова: HTS, YBCO, chemical solution deposition, critical current density, angular dependence, temperature dependence, pinning centers, defects, anisotropy, Jc/B curves, nanoscaled effects, composites, microstructure, pinning force, dislocations, irreversibility fields, experimental results, presentation, coated conductors, critical caracteristics, magnetic properties
Martin P., Paranthaman M., Thompson J.R., Kang S., Li J., Goyal A.(goyala@ornl.gov), Ijaduola A.
Huhtinen H., Paturi P., Peurla M., Laiho R., Traito K., Stepanov Y.P., Safonchik M., Tse Y.Y., Shakhov M.A., Palai R.
Ключевые слова: HTS, YBCO, doping effect, nanopowder target, nanoscaled effects, defects columnar, pinning, PLD process, substrate SrTiO3, Jc/B curves, pulsed operation, resistivity, magnetic field dependence, upper critical fields, irreversibility fields, experimental results, critical caracteristics, fabrication, magnetic properties
Rupich M.W., Li X., Zhang W., Kodenkandath T., Strickland N.M., Huang Y., Xia J.A.(j.xia@irl.cri.nz), Long N.J., Hoefakker P., Talantsev E.F.
Ключевые слова: HTS, YBCO, doping effect, coated conductors, MOD process, defects, critical current density, angular dependence, fabrication, critical caracteristics
Ключевые слова: measurement setup, defects, wires, length
Ключевые слова: HTS, YBCO, films thick, substrate SrTiO3, PLD process, fabrication, Jc/B curves, angular dependence, defects, pinning, experimental results, critical caracteristics
Rupich M.W., Li X., Zhang W., Kodenkandath T., Strickland N.M., Huang Y., Xia J., Long N.J., Kennedy J., Markwitz A., Zondervan A.
Ключевые слова: HTS, YBCO, MOD process, coated conductors, ion irradiation, defects, critical current, angular dependence, pinning, experimental results, critical caracteristics, fabrication
Miller D.J., Maroni V.A., Rupich M.W., Li X., Kodenkandath T., Holesinger T.G., Civale L., Maiorov B., Huang Y., Arenal R.
Nakamura T., Kiss T., Shiohara Y., Inoue M., Imamura K., Kato T., Yamada Y., Hirayama T., Ibi A., Shoyama T., Koyanagi S., Mitsui D.
Ключевые слова: HTS, YBCO, films, defects, measurement technique
Ключевые слова: HTS, YBCO, bulk, doping effect, nanoscaled effects, twin boundaries, irreversibility fields, defects, Jc/B curves, microstructure, pinning, critical caracteristics, magnetic properties
Ключевые слова: HTS, YBCO, bulk, cylinders, ion irradiation, defects, nanoscaled effects, experimental results
Ключевые слова: HTS, YBCO, coated conductors, MOD process, RABITS process, defects, pinning, substrate single crystal, comparison, PLD process, experimental results, fabrication
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.