Puig T., Palau A., Obradors X., Pomar A., Sandiumenge F., Mestres N., Gazquez J., Gutierrez J., Roma N., Ricart S., Gibert M., Llordes A., Carretero A., Moreno C., Abellan P., Zabaleta J.
Ключевые слова: presentation, HTS, YBCO, chemical solution deposition, buffer layers, TFA-MOD process, precursors, nanodots, nucleation, fabrication, nanoscaled effects, pinning, microstructure, defects, strain effects, anisotropy, critical current density, angular dependence, critical caracteristics, temperature dependence, Jc/B curves, interfaces, pinning force, thickness dependence, experimental results
Ключевые слова: presentation, HTS, REBCO, coated conductors, long conductors, defects, microstructure, fabrication, Korea
Cherpak Y.V., Semenov A.V., Tretiatchenko C.G., Pan V.M., Moskaliuk V.O., Svetchnikov V.L., Flis V.S.
Ключевые слова: HTS, YBCO, films epitaxial, defects columnar, nanoscaled effects, critical current, modeling, numerical analysis, pinning, critical caracteristics
Ключевые слова: MgB2, films thick, substrate sapphire, defects columnar, grain size, pinning force, microstructure, experimental results
Ключевые слова: MgB2/Fe, doping effect, wires, interfaces, defects, measurement technique, Jc/B curves, PIT process, microstructure, critical caracteristics, fabrication
Ключевые слова: patents, fabrication, wires, PIT process, densification, defects, critical current density, critical caracteristics
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, RABITS process, MOD process, critical current, thickness dependence, angular dependence, precursors, microstructure, pinning, defects, grain boundaries, nucleation, Jc/B curves, dissipative properties, irreversibility fields, nanoscaled effects, pinning force, magnetic field dependence, review, critical caracteristics, magnetic properties
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, RABITS process, nanoscaled effects, pinning mechanism, defects columnar, fabrication, presentation
Jia Q.X., Wang H., MacManus-Driscoll J.L., Civale L., Maiorov B., Holesinger T., Foltyn S., Hengstberger F., Durrell J., Harrington S., Kurumovic A., Wimbush S., Lia M.C., Vickers M.E., Dunlop L., Weber H., Rikel V.M.
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
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