Ключевые слова: HTS, coated conductors, substrate Ni, buffer layers, chemical solution deposition, microstructure, texture, fabrication
Ключевые слова: HTS, coated conductor modules, substrate Ni-W, buffer layers, MOD process, texture, microstructure, films epitaxial, fabrication
Barnes P.N., Sathiraju S.(srinivas.sathiraju@wpafb.af.mil), Varanasi C.(chakrapani.varanasi@wpafb.af.mil), Wheeler R.(robert.wheeler@wpafb.af.mil)
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, buffer layers, IBAD process, microstructure, texture, fabrication
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, substrate single crystal, buffer layers, spin coating process, precursors, heat treatment, texture, fabrication
Ключевые слова: HTS, YBCO, coated conductors, PLD process, buffer layers, RABITS process, substrate Ni-W, texture, films epitaxial, fabrication
Holzapfel B., Kursumovic A., Evetts J.E., Puig T., Obradors X., Pomar A., Sandiumenge F., Cavallaro A., Huhne R.(r.huehne@ifw-dresden.de)
Ключевые слова: HTS, substrate Ni-Mn, surface oxidation, template layers, buffer layers, PLD process, MOD process, fabrication
Ключевые слова: HTS, coated conductors, buffer layers, ISD process, surface, microstructure, substrate Hastelloy, PLD process, thickness dependence, angular dependence, fabrication
Kumakura H., Nakane T., Jiang C.H.(jiang.chunhai@nims.go.jp)
Ключевые слова: HTS, PIT process, critical current density, Jc/B curves, microstructure, fabrication, experimental results, critical caracteristics
Evetts J.E., Kursumovic A.(ak237@cus.cam.ac.uk), Foltyn S.R., Jia Q.X., Wang H., MacManus-Driscoll J.L., Civale L., Maiorov B.
Chen J., Li Q., Mielke C.H., Pogrebnyakov A.V., Xi X.X., Redwing J.M., Ferrando V., Giencke J.E., Orgiani P., Eom C., Feng Q., Betts J.B.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, nanodoping, PLD process, microstructure, Jc/B curves, fabrication, experimental results, critical caracteristics
Iijima Y., Goto T., Saitoh T., Teranishi R., Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Yoshinaka A., Nakaoka K., Kitoh Y.
Puig T., Obradors X., Sandiumenge F., Mestres N., Coll M., Cavallaro A., Gazquez J., Gonzalez J.C., Pomar A.(apomar@icmab.es)
Kim H.-J., Kim C.-J., Jun B.-H.(bhjun@kaeri.re.kr), Choi J.-K.
Weiss F., Bruzek C.E., Vergnieres L.(laura.vergnieres@inpg.fr), Donet S.(sebastien.donet@inpg.fr), Jimenez C.(carmen.jimenez@inpg.fr), Odier P.(odier@grenoble.cnrs.fr), Saugrain J.M.(Jean_Maxime.Saugrain@nexans.com)
Ключевые слова: HTS, YBCO, coated conductors, substrate CeO2/IBAD-YSZ/Ni alloy, MOCVD process, spray pyrolysis process, fabrication, microstructure
Muroga T., Nagaya S., Kashima N., Izumi T., Shiohara Y., Yamada Y., Miyata S., Watanabe T.(t-nabe@istec.or.jp), Niwa T.(Niwa.Toshiharu@chuden.co.jp), Mori M.(Mori.Masami2@chuden.co.jp)
Ключевые слова: HTS, YBCO, coated conductor modules, CVD process, multistage process, substrate Hastelloy, microstructure, texture, growth rate, fabrication
Joo J., Kim C.-J., Jun B.-H., Choi J.-K., Kim H.-J.(sep1040@skku.ac.kr)
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