Puig T., Obradors X., Ricart S., Soler L., Farjas J., Mocuta C., Jareсo J., Banchewski J., Rasi S., Roura-Grabulosa P., Queraltу A., Pacheco A., Gupta K., Saltarelli L., Garcia D., Kethamkuzhi A.
Hu J., Chen D., Zhang X., Hu Y., Li P., Tao J., Yang L., Pan M., Peng J., Zhang Q., Qiu W., Ji M., Sun K.
Ключевые слова: measurement technique, magnetic flux distribution, sensors, HTS, DyBCO, magnetoresistivity, measurement setup, experimental results
Ключевые слова: HTS, REBCO, tapes, contact characteristics, resistivity, impregnation, coils pancake, discharge characteristics, test results
Ключевые слова: MgB2, tapes, fabrication, powder processing, milling process, ex-situ process, doping, metal, sintering, grain structure, critical temperature, Jc/B curves, magnetization, temperature dependence, RRR parameter, resistivity, upper critical fields, irreversibility fields, microstructure, X-ray diffraction, experimental results
Man N.K., Tran D.H., Miyanaga T., Pham A.T., Tran D.T., Klysubun W., Vu L.H., Thien N.D., Duong N.T., Long N.T., Pham P.V., Binh N.T.
Ключевые слова: HTS, Bi2223, doping, solid-state synthesis, bulk, fabrication, resistivity, temperature dependence, critical temperature, experimental results
Ключевые слова: HTS, Bi2223, bulk, precursors, nanoscaled effects, fabrication, melting, texture, phase composition, microstructure, resistivity, X-ray diffraction
Yang P., Ishida K., Mackenzie A.P., Loew T., Tacon M.L., Keimer B., Minola M., Nakata S., Barber M.E., Kim H.-H., Hicks C.W.
Ключевые слова: HTS, YBCO, mechanical properties, stress effects, resistivity, Hall effect, oxygen, composition, measurement setup, experimental results
Ключевые слова: HTS, Bi2212, films, fabrication, sol gel process, substrate LaAlO3, substrate SrTiO3, microstructure, surface, roughness, resistivity, temperature dependence, resistive transition, magnetic field dependence, irreversibility fields, critical temperature, X-ray diffraction, experimental results
Ключевые слова: MgB2, thin films, fabrication, PLD process, in-situ process, annealing process, magnetization, resistivity, temperature dependence, X-ray diffraction, Jc/B curves
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