Ключевые слова: HTS, coated conductors, fabrication, substrate Hastelloy, buffer layers, planarization, MOD process, roughness, YBCO, PLD process, laminations
Puig T., Palau A., Obradors X., Usoskin A., Vlad R., Vilardell M., Calleja A., Fornell J., Sort J., Fernandez J.C., Puig J.
Ключевые слова: HTS, coated conductors, REBCO, planarization, IBAD process, mechanical properties, laminations, experimental results, microstructure, delamination
Gierlowski P., Barbanera S., Окунев В.Д., Самойленко З.А., Lewandowski S.J., Дьяченко Т.А., Исаев В.А., Пушенко Е.И., Варюхин В.Н.
Ключевые слова: HTS, YBCO, films epitaxial, substrate LaAlO3, substrate SrTiO3, laser irradiation, planarization
Ключевые слова: HTS, REBCO, economic analysis, RCE-CDR process, coated conductors, fabrication, oxygenation treatments, phase diagram, microstructure, substrate stainless steel, critical caracteristics, critical current, long conductors, homogeneity, substrate Hastelloy, current-voltage characteristics, joint resistances, pinning, critical current density, angular dependence, buffer layers, planarization, magnets, coils pancake, cooling technology, cryogenic systems, conduction cooled systems, measurement setup, review, presentation, new
Ключевые слова: HTS, coated conductors, REBCO, planarization, IBAD process, RCE-CDR process, fabrication, high rate process, long conductors, uniformity, critical caracteristics, critical current, critical current density, angular dependence, magnetic field dependence, review, fabrication, presentation
Matias V., Coulter Y., Sheehan C., Yung C., Glyantsev V., Huh J., Turner P., Dawley J., Maiorov B.M.
Ключевые слова: HTS, coated conductors, fabrication, template layers, planarization, solution techniques, IBAD process, RCE-CDR process, critical caracteristics, n-value, critical current, critical current density, angular dependence, thickness dependence, magnetic field dependence, homogeneity, growth rate, presentation
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, co-evaporation process, cycling, planarization, fabrication, solution techniques, roughness, microstructure, width
Ключевые слова: funding, plans, collaborations, HTS, YBCO, coated conductors, IBAD process, co-evaporation process, planarization, fabrication, presentation
Ключевые слова: funding, plans, collaborations, HTS, YBCO, coated conductors, fibers, RABITS process, buffer layers, IBAD process, substrate Ni-W, planarization, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, commercialization, long conductors, fabrication, roughness, planarization, texture, substrate Hastelloy, microstructure, irradiation effects, growth rate, defects, pinning, critical caracteristics, critical current density, angular dependence, Jc/B curves, nanoscaled effects, nanodots, phase composition, defects columnar, homogeneity, critical current, thickness dependence
Ключевые слова: funding, plans, collaborations, HTS, YBCO, coated conductor modules, chemical solution deposition, substrate Ni-W, planarization, presentation
Ключевые слова: funding, plans, collaborations, HTS, coated conductors, template layers, IBAD process, texture, long conductors, planarization, substrate stainless steel, fabrication, presentation
Ключевые слова: funding, plans, HTS, YBCO, coated conductors, IBAD process, MOCVD process, fabrication, planarization, control systems, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, critical caracteristics, critical current, angular dependence, homogeneity, long conductors, doping effect, coils, economic analysis, planarization, roughness, solution techniques, microstructure, magnetic field dependence, temperature dependence, Jc/B curves, flux creep, pinning, experimental results
Matias V., Maiorov B., Moeckly B., Coulter Y., Sheehan C., Yung C., Glyantsev V., Ruby W., Huh J., Turner P.
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, solution techniques, planarization, long conductors, co-evaporation process, critical caracteristics, critical current, critical current density, n-value, Jc/B curves, angular dependence, pinning, substrate Hastelloy, fabrication
Izumi T., Shiohara Y., Aoki Y., Hasegawa T., Ito T., Takahashi Y., Hatakeyama H., Miyata S., Yoshizumi M.
Ключевые слова: presentation, HTS, coated conductors, roughness, IBAD process, buffer layers, texture, fabrication, substrate Hastelloy, planarization, MOD process, PLD process, microstructure
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