Ferdeghini C., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Bellingeri E., Sylva G.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, RABITS process, template layers, fabrication, substrate Ni-W, X-ray diffraction, PLD process, microstructure, buffer layers, texture, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: presentation, pnictides, wires, tapes, review, critical caracteristics, upper critical fields, anisotropy, Jc/B curves, coated conductors, PLD process, molecular beam epitaxy, resistance, critical current density, temperature dependence, pinning force, chalcogenide, resistivity, microstructure, PIT process, texture, porosity, hot isostatic pressing, mechanical treatment, sintering, current-voltage characteristics, fabrication, sheath, strain effects, mechanical properties, bending radius, tensile tests, joints, long conductors, coils pancake, coils racetrack, review
Ключевые слова: chalcogenide, FeSe, sheath, wires, fabrication, sintering, PIT process, X-ray diffraction, magnetization, critical temperature
Ключевые слова: chalcogenide, FeSe, tapes, sheath, precursors, powder processing, fabrication, PIT process, X-ray diffraction, microstructure, magnetization
Ключевые слова: chalcogenide, coated conductors, PLD process, IBAD process, buffer layers, substrate metallic, resistive transition, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, critical current density, angular dependence, anisotropy
Ключевые слова: FeSe, chalcogenide, tapes, in-situ process, ex-situ process, fabrication, PIT process, X-ray diffraction, composition, sintering, microstructure, magnetization
Ferdeghini C., Braccini V., Pace S., Guarino A., Grimaldi G., Leo A., Nigro A., Bellingeri E., Avitabile F., Marra P., Citro R.
Ключевые слова: bulk, HTS, LTS, pnictides, MgB2, chalcogenide, comparison, grain boundaries, resistivity, critical caracteristics, Jc/B curves, temperature dependence, upper critical fields, irreversibility fields, YBCO, fabrication, grain size, resistivity, heat treatment, X-ray diffraction, microstructure, resistive transition, current-voltage characteristics, magnetization, susceptibility, magnetization curves, hysteresis, numerical analysis, review, nanoscaled effects
Holzapfel B., Yamaguchi T., Iida K., Takeya H., Takano Y., Tanaka M., Fujioka M., Demura S., Okazaki H., Yamashita A., Denholme S.J., Sakata H.
Ключевые слова: chalcogenide, FeSe, RABITS process, tapes, electrochemical process, fabrication, critical temperature, susceptibility
Ferdeghini C., Braccini V., Sarnelli E., Bellingeri E., Kawale S., Buzio R., Gerbi A., Adamo M., Nappi C.
Ключевые слова: PIT process, fabrication, anisotropy, pinning force, MRI magnets, pnictides, resistance, temperature dependence, phase diagram, doping effect, chalcogenide, presentation, MgB2, upper critical fields, doping effect, critical temperature, thin films, critical caracteristics, Jc/B curves, temperature dependence, angular dependence, microstructure, grain boundaries
Ключевые слова: shields, irradiation effects, gamma irradiation, Tokamak, chalcogenide, HTS, Bi2212, experimental results, high field magnets, new
Paranthaman M.P., Tomsic M., Rindfleisch M., Sefat A.S., Mitchell J.E., Hillesheim D.A., Bridges C.A., Gofryk K.
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